Ghost-imaging-enhanced noninvasive spectral characterization of stochastic x-ray free-electron-laser pulses
Abstract
Abstract High-intensity ultrashort X-ray free-electron laser (XFEL) pulses are revolutionizing the study of fundamental nonlinear x-ray matter interactions and coupled electronic and nuclear dynamics. To fully exploit the potential of this powerful tool for advanced x-ray spectroscopies, a noninvasive spectral characterization of incident stochastic XFEL pulses with high resolution is a key requirement. Here we present a methodology that combines high-acceptance angle-resolved photoelectron time-of-flight spectroscopy and ghost imaging to enhance the quality of spectral characterization of x-ray free-electron laser pulses. Implementation of this noninvasive high-resolution x-ray diagnostic can greatly benefit the ultrafast x-ray spectroscopy community by functioning as a transparent beamsplitter for applications such as transient absorption spectroscopy in averaging mode as well as covariance-based x-ray nonlinear spectroscopies in single-shot mode where the shot-to-shot fluctuations inherent to a self-amplified spontaneous emission (SASE) XFEL pulse are a powerful asset.
- Publication Date:
- Research Org.:
- Argonne National Laboratory (ANL), Argonne, IL (United States)
- Sponsoring Org.:
- USDOE; USDOE Office of Science (SC), Basic Energy Sciences (BES). Chemical Sciences, Geosciences & Biosciences Division
- OSTI Identifier:
- 1877723
- Alternate Identifier(s):
- OSTI ID: 1962796
- Grant/Contract Number:
- AC02-06CH11357
- Resource Type:
- Published Article
- Journal Name:
- Communications Physics
- Additional Journal Information:
- Journal Name: Communications Physics Journal Volume: 5 Journal Issue: 1; Journal ID: ISSN 2399-3650
- Publisher:
- Nature Publishing Group
- Country of Publication:
- United Kingdom
- Language:
- English
- Subject:
- 72 PHYSICS OF ELEMENTARY PARTICLES AND FIELDS; Enhanced; Ghost Imaging; Stochastic
Citation Formats
Li, Kai, Laksman, Joakim, Mazza, Tommaso, Doumy, Gilles, Koulentianos, Dimitris, Picchiotti, Alessandra, Serkez, Svitozar, Rohringer, Nina, Ilchen, Markus, Meyer, Michael, and Young, Linda. Ghost-imaging-enhanced noninvasive spectral characterization of stochastic x-ray free-electron-laser pulses. United Kingdom: N. p., 2022.
Web. doi:10.1038/s42005-022-00962-8.
Li, Kai, Laksman, Joakim, Mazza, Tommaso, Doumy, Gilles, Koulentianos, Dimitris, Picchiotti, Alessandra, Serkez, Svitozar, Rohringer, Nina, Ilchen, Markus, Meyer, Michael, & Young, Linda. Ghost-imaging-enhanced noninvasive spectral characterization of stochastic x-ray free-electron-laser pulses. United Kingdom. https://doi.org/10.1038/s42005-022-00962-8
Li, Kai, Laksman, Joakim, Mazza, Tommaso, Doumy, Gilles, Koulentianos, Dimitris, Picchiotti, Alessandra, Serkez, Svitozar, Rohringer, Nina, Ilchen, Markus, Meyer, Michael, and Young, Linda. Mon .
"Ghost-imaging-enhanced noninvasive spectral characterization of stochastic x-ray free-electron-laser pulses". United Kingdom. https://doi.org/10.1038/s42005-022-00962-8.
@article{osti_1877723,
title = {Ghost-imaging-enhanced noninvasive spectral characterization of stochastic x-ray free-electron-laser pulses},
author = {Li, Kai and Laksman, Joakim and Mazza, Tommaso and Doumy, Gilles and Koulentianos, Dimitris and Picchiotti, Alessandra and Serkez, Svitozar and Rohringer, Nina and Ilchen, Markus and Meyer, Michael and Young, Linda},
abstractNote = {Abstract High-intensity ultrashort X-ray free-electron laser (XFEL) pulses are revolutionizing the study of fundamental nonlinear x-ray matter interactions and coupled electronic and nuclear dynamics. To fully exploit the potential of this powerful tool for advanced x-ray spectroscopies, a noninvasive spectral characterization of incident stochastic XFEL pulses with high resolution is a key requirement. Here we present a methodology that combines high-acceptance angle-resolved photoelectron time-of-flight spectroscopy and ghost imaging to enhance the quality of spectral characterization of x-ray free-electron laser pulses. Implementation of this noninvasive high-resolution x-ray diagnostic can greatly benefit the ultrafast x-ray spectroscopy community by functioning as a transparent beamsplitter for applications such as transient absorption spectroscopy in averaging mode as well as covariance-based x-ray nonlinear spectroscopies in single-shot mode where the shot-to-shot fluctuations inherent to a self-amplified spontaneous emission (SASE) XFEL pulse are a powerful asset.},
doi = {10.1038/s42005-022-00962-8},
journal = {Communications Physics},
number = 1,
volume = 5,
place = {United Kingdom},
year = {Mon Jul 25 00:00:00 EDT 2022},
month = {Mon Jul 25 00:00:00 EDT 2022}
}
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