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Title: Using Diffuse Scattering to Observe X-Ray-Driven Nonthermal Melting

Abstract

In this work, we present results from the SPring-8 Angstrom Compact free electron LAser facility, where we used a high intensity (~1020 W/cm2) x-ray pump x-ray probe scheme to observe changes in the ionic structure of silicon induced by x-ray heating of the electrons. By avoiding Laue spots in the scattering signal from a single crystalline sample, we observe a rapid rise in diffuse scattering and a transition to a disordered, liquidlike state with a structure significantly different from liquid silicon. The disordering occurs within 100 fs of irradiation, a timescale that agrees well with first principles simulations, and is faster than that predicted by purely inertial behavior, suggesting that both the phase change and disordered state reached are dominated by Coulomb forces. This method is capable of observing liquid scattering without masking signal from the ambient solid, allowing the liquid structure to be measured throughout and beyond the phase change.

Authors:
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Publication Date:
Research Org.:
SLAC National Accelerator Lab., Menlo Park, CA (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES); Japan Society for the Promotion of Science (JSPS); Japan Synchrotron Radiation Research Institute (JASRI); Australian Research Council
OSTI Identifier:
1755990
Alternate Identifier(s):
OSTI ID: 1768246
Grant/Contract Number:  
16K17846; VH-NG-1141; DP170100131; AC02-76SF00515; 2017B8075; 2018A8056
Resource Type:
Published Article
Journal Name:
Physical Review Letters
Additional Journal Information:
Journal Name: Physical Review Letters Journal Volume: 126 Journal Issue: 1; Journal ID: ISSN 0031-9007
Publisher:
American Physical Society (APS)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY

Citation Formats

Hartley, N. J., Grenzer, J., Huang, L., Inubushi, Y., Kamimura, N., Katagiri, K., Kodama, R., Kon, A., Lu, W., Makita, M., Matsuoka, T., Nakajima, S., Ozaki, N., Pikuz, T., Rode, A. V., Sagae, D., Schuster, A. K., Tono, K., Voigt, K., Vorberger, J., Yabuuchi, T., McBride, E. E., and Kraus, D.. Using Diffuse Scattering to Observe X-Ray-Driven Nonthermal Melting. United States: N. p., 2021. Web. https://doi.org/10.1103/PhysRevLett.126.015703.
Hartley, N. J., Grenzer, J., Huang, L., Inubushi, Y., Kamimura, N., Katagiri, K., Kodama, R., Kon, A., Lu, W., Makita, M., Matsuoka, T., Nakajima, S., Ozaki, N., Pikuz, T., Rode, A. V., Sagae, D., Schuster, A. K., Tono, K., Voigt, K., Vorberger, J., Yabuuchi, T., McBride, E. E., & Kraus, D.. Using Diffuse Scattering to Observe X-Ray-Driven Nonthermal Melting. United States. https://doi.org/10.1103/PhysRevLett.126.015703
Hartley, N. J., Grenzer, J., Huang, L., Inubushi, Y., Kamimura, N., Katagiri, K., Kodama, R., Kon, A., Lu, W., Makita, M., Matsuoka, T., Nakajima, S., Ozaki, N., Pikuz, T., Rode, A. V., Sagae, D., Schuster, A. K., Tono, K., Voigt, K., Vorberger, J., Yabuuchi, T., McBride, E. E., and Kraus, D.. Wed . "Using Diffuse Scattering to Observe X-Ray-Driven Nonthermal Melting". United States. https://doi.org/10.1103/PhysRevLett.126.015703.
@article{osti_1755990,
title = {Using Diffuse Scattering to Observe X-Ray-Driven Nonthermal Melting},
author = {Hartley, N. J. and Grenzer, J. and Huang, L. and Inubushi, Y. and Kamimura, N. and Katagiri, K. and Kodama, R. and Kon, A. and Lu, W. and Makita, M. and Matsuoka, T. and Nakajima, S. and Ozaki, N. and Pikuz, T. and Rode, A. V. and Sagae, D. and Schuster, A. K. and Tono, K. and Voigt, K. and Vorberger, J. and Yabuuchi, T. and McBride, E. E. and Kraus, D.},
abstractNote = {In this work, we present results from the SPring-8 Angstrom Compact free electron LAser facility, where we used a high intensity (~1020 W/cm2) x-ray pump x-ray probe scheme to observe changes in the ionic structure of silicon induced by x-ray heating of the electrons. By avoiding Laue spots in the scattering signal from a single crystalline sample, we observe a rapid rise in diffuse scattering and a transition to a disordered, liquidlike state with a structure significantly different from liquid silicon. The disordering occurs within 100 fs of irradiation, a timescale that agrees well with first principles simulations, and is faster than that predicted by purely inertial behavior, suggesting that both the phase change and disordered state reached are dominated by Coulomb forces. This method is capable of observing liquid scattering without masking signal from the ambient solid, allowing the liquid structure to be measured throughout and beyond the phase change.},
doi = {10.1103/PhysRevLett.126.015703},
journal = {Physical Review Letters},
number = 1,
volume = 126,
place = {United States},
year = {2021},
month = {1}
}

Journal Article:
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https://doi.org/10.1103/PhysRevLett.126.015703

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