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Title: Far Infrared Synchrotron Near-Field Nanoimaging and Nanospectroscopy

Abstract

Scattering scanning near-field optical microscopy ($$s$$-SNOM) has emerged as a powerful imaging and spectroscopic tool for investigating nanoscale heterogeneities in biology, quantum matter, and electronic and photonic devices. However, many materials are defined by a wide range of fundamental molecular and quantum states at far-infrared (FIR) resonant frequencies currently not accessible by $$s$$-SNOM. Here we show ultrabroadband FIR $$s$$-SNOM nanoimaging and spectroscopy by combining synchrotron infrared radiation with a novel fast and low-noise copper-doped germanium (Ge:Cu) photoconductive detector. This approach of FIR synchrotron infrared nanospectroscopy (SINS) extends the wavelength range of $$s$$-SNOM to 31 μm (320 cm-1, 9.7 THz), exceeding conventional limits by an octave to lower energies. We demonstrate this new nanospectroscopic window by measuring elementary excitations of exemplary functional materials, including surface phonon polariton waves and optical phonons in oxides and layered ultrathin van der Waals materials, skeletal and conformational vibrations in molecular systems, and the highly tunable plasmonic response of graphene.

Authors:
ORCiD logo [1];  [2];  [2]; ORCiD logo [3];  [4]
+ Show Author Affiliations
  1. Univ. of Colorado, Boulder, CO (United States); Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
  2. Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
  3. Univ. of Colorado, Boulder, CO (United States)
  4. Brookhaven National Lab. (BNL), Upton, NY (United States)
Publication Date:
Research Org.:
Brookhaven National Lab. (BNL), Upton, NY (United States); Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES)
OSTI Identifier:
1439299
Alternate Identifier(s):
OSTI ID: 1526534
Report Number(s):
BNL-205714-2018-JAAM
Journal ID: ISSN 2330-4022
Grant/Contract Number:  
SC0012704; AC02-05CH11231
Resource Type:
Accepted Manuscript
Journal Name:
ACS Photonics
Additional Journal Information:
Journal Volume: 5; Journal Issue: 7; Journal ID: ISSN 2330-4022
Publisher:
American Chemical Society (ACS)
Country of Publication:
United States
Language:
English
Subject:
77 NANOSCIENCE AND NANOTECHNOLOGY; far-infrared; graphene plasmonics; near-field microscopy; s-SNOM; spatiospectral nanoimaging; synchrotron infrared nanospectroscopy; 47 OTHER INSTRUMENTATION

Citation Formats

Khatib, Omar, Bechtel, Hans A., Martin, Michael C., Raschke, Markus B., and Carr, G. Lawrence. Far Infrared Synchrotron Near-Field Nanoimaging and Nanospectroscopy. United States: N. p., 2018. Web. doi:10.1021/acsphotonics.8b00565.
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Khatib, Omar, Bechtel, Hans A., Martin, Michael C., Raschke, Markus B., & Carr, G. Lawrence. Far Infrared Synchrotron Near-Field Nanoimaging and Nanospectroscopy. United States. https://doi.org/10.1021/acsphotonics.8b00565
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Khatib, Omar, Bechtel, Hans A., Martin, Michael C., Raschke, Markus B., and Carr, G. Lawrence. Fri . "Far Infrared Synchrotron Near-Field Nanoimaging and Nanospectroscopy". United States. https://doi.org/10.1021/acsphotonics.8b00565. https://www.osti.gov/servlets/purl/1439299.
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@article{osti_1439299,
title = {Far Infrared Synchrotron Near-Field Nanoimaging and Nanospectroscopy},
author = {Khatib, Omar and Bechtel, Hans A. and Martin, Michael C. and Raschke, Markus B. and Carr, G. Lawrence},
abstractNote = {Scattering scanning near-field optical microscopy ($s$-SNOM) has emerged as a powerful imaging and spectroscopic tool for investigating nanoscale heterogeneities in biology, quantum matter, and electronic and photonic devices. However, many materials are defined by a wide range of fundamental molecular and quantum states at far-infrared (FIR) resonant frequencies currently not accessible by $s$-SNOM. Here we show ultrabroadband FIR $s$-SNOM nanoimaging and spectroscopy by combining synchrotron infrared radiation with a novel fast and low-noise copper-doped germanium (Ge:Cu) photoconductive detector. This approach of FIR synchrotron infrared nanospectroscopy (SINS) extends the wavelength range of $s$-SNOM to 31 μm (320 cm-1, 9.7 THz), exceeding conventional limits by an octave to lower energies. We demonstrate this new nanospectroscopic window by measuring elementary excitations of exemplary functional materials, including surface phonon polariton waves and optical phonons in oxides and layered ultrathin van der Waals materials, skeletal and conformational vibrations in molecular systems, and the highly tunable plasmonic response of graphene.},
doi = {10.1021/acsphotonics.8b00565},
journal = {ACS Photonics},
number = 7,
volume = 5,
place = {United States},
year = {Fri May 11 00:00:00 EDT 2018},
month = {Fri May 11 00:00:00 EDT 2018}
}
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Journal Article:
Free Publicly Available Full Text
Publisher's Version of Record
https://doi.org/10.1021/acsphotonics.8b00565
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Cited by: 53 works
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Figures / Tables:

Figure 1 Figure 1: (a) Infrared energy scales and associated phenomena in molecular and quantum matter; (b) Top: ultrabroadband SINS experimental configuration with extension to far-infrared frequencies; bottom: SINS reference spectrum using MCT (black curve) and Ge:Cu (red curve) detectors, demonstrating extended near-field spectroscopic performance at frequencies down to 320 cm−1.
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    Works referencing / citing this record:

    Ultrabroadband infrared near-field spectroscopy and imaging of local resonators in percolative gold films
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    Comparison of active and passive methods for the infrared scanning near-field microscopy
    journal, April 2019

    • Weng, Qianchun; Panchal, Vishal; Lin, Kuan-Ting
    • Applied Physics Letters, Vol. 114, Issue 15
    • DOI: 10.1063/1.5088056

    Infrared nanospectroscopic imaging in the rotating frame
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    Probing Polaritons in 2D Materials with Synchrotron Infrared Nanospectroscopy
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    • Barcelos, Ingrid D.; Bechtel, Hans A.; de Matos, Christiano J. S.
    • Advanced Optical Materials, Vol. 8, Issue 5
    • DOI: 10.1002/adom.201901091

    Modern Scattering‐Type Scanning Near‐Field Optical Microscopy for Advanced Material Research
    journal, April 2019

    Nanoimaging and Nanospectroscopy of Polaritons with Time Resolved s ‐SNOM
    journal, September 2019

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