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Title: Modern Scattering‐Type Scanning Near‐Field Optical Microscopy for Advanced Material Research

Authors:
ORCiD logo [1] ;  [2] ;  [1] ;  [3] ;  [4] ;  [2] ;  [1]
  1. Department of Physics and AstronomyStony Brook University Stony Brook NY 11794 USA
  2. Division of NanophotonicsCAS Center for Excellence in NanoscienceNational Center for Nanoscience and Technology Beijing 100190 China
  3. Shanghai Key Lab of Modern Optical Systems and Engineering Research Center of Optical Instrument and SystemMinistry of EducationUniversity of Shanghai for Science and Technology Shanghai 200093 China
  4. Department of PhysicsColumbia University New York NY 10027 USA
Publication Date:
Grant/Contract Number:
DE‐SC0019443
Type:
Publisher's Accepted Manuscript
Journal Name:
Advanced Materials
Additional Journal Information:
Journal Name: Advanced Materials; Journal ID: ISSN 0935-9648
Publisher:
Wiley Blackwell (John Wiley & Sons)
Sponsoring Org:
USDOE
Country of Publication:
Germany
Language:
English
OSTI Identifier:
1504499

Chen, Xinzhong, Hu, Debo, Mescall, Ryan, You, Guanjun, Basov, D. N., Dai, Qing, and Liu, Mengkun. Modern Scattering‐Type Scanning Near‐Field Optical Microscopy for Advanced Material Research. Germany: N. p., Web. doi:10.1002/adma.201804774.
Chen, Xinzhong, Hu, Debo, Mescall, Ryan, You, Guanjun, Basov, D. N., Dai, Qing, & Liu, Mengkun. Modern Scattering‐Type Scanning Near‐Field Optical Microscopy for Advanced Material Research. Germany. doi:10.1002/adma.201804774.
Chen, Xinzhong, Hu, Debo, Mescall, Ryan, You, Guanjun, Basov, D. N., Dai, Qing, and Liu, Mengkun. 2019. "Modern Scattering‐Type Scanning Near‐Field Optical Microscopy for Advanced Material Research". Germany. doi:10.1002/adma.201804774.
@article{osti_1504499,
title = {Modern Scattering‐Type Scanning Near‐Field Optical Microscopy for Advanced Material Research},
author = {Chen, Xinzhong and Hu, Debo and Mescall, Ryan and You, Guanjun and Basov, D. N. and Dai, Qing and Liu, Mengkun},
abstractNote = {},
doi = {10.1002/adma.201804774},
journal = {Advanced Materials},
number = ,
volume = ,
place = {Germany},
year = {2019},
month = {4}
}

Works referenced in this record:

Surface-Enhanced Raman Spectroscopy
journal, July 2008

High dielectric constant oxides
journal, December 2004
  • Robertson, J.
  • The European Physical Journal Applied Physics, Vol. 28, Issue 3, p. 265-291
  • DOI: 10.1051/epjap:2004206