Modern Scattering‐Type Scanning Near‐Field Optical Microscopy for Advanced Material Research

doi:10.1002/adma.201804774

This content will become publicly available on March 31, 2020

Title: Modern Scattering‐Type Scanning Near‐Field Optical Microscopy for Advanced Material Research

Authors:

; Hu, Debo ^[2] ; Mescall, Ryan ^[1] ; You, Guanjun ^[3] ; Basov, D. N. ^[4] ; Dai, Qing ^[2] ; Liu, Mengkun ^[1]

Department of Physics and AstronomyStony Brook University Stony Brook NY 11794 USA
Division of NanophotonicsCAS Center for Excellence in NanoscienceNational Center for Nanoscience and Technology Beijing 100190 China
Shanghai Key Lab of Modern Optical Systems and Engineering Research Center of Optical Instrument and SystemMinistry of EducationUniversity of Shanghai for Science and Technology Shanghai 200093 China
Department of PhysicsColumbia University New York NY 10027 USA

Publication Date:: 2019-04-01

Grant/Contract Number:: DE‐SC0019443

Type:: Publisher's Accepted Manuscript

Journal Name:: Advanced Materials

Additional Journal Information:: Journal Name: Advanced Materials; Journal ID: ISSN 0935-9648

Publisher:: Wiley Blackwell (John Wiley & Sons)

Sponsoring Org:: USDOE

Country of Publication:: Germany

Language:: English

OSTI Identifier:: 1504499


                    Chen, Xinzhong, Hu, Debo, Mescall, Ryan, You, Guanjun, Basov, D. N., Dai, Qing, and Liu, Mengkun. Modern Scattering‐Type Scanning Near‐Field Optical Microscopy for Advanced Material Research.  Germany: N. p.,  
        Web.  doi:10.1002/adma.201804774.

Copy to clipboard


                    Chen, Xinzhong, Hu, Debo, Mescall, Ryan, You, Guanjun, Basov, D. N., Dai, Qing, & Liu, Mengkun. Modern Scattering‐Type Scanning Near‐Field Optical Microscopy for Advanced Material Research.  Germany.  doi:10.1002/adma.201804774.

Copy to clipboard


                    Chen, Xinzhong, Hu, Debo, Mescall, Ryan, You, Guanjun, Basov, D. N., Dai, Qing, and Liu, Mengkun. 2019.  
        "Modern Scattering‐Type Scanning Near‐Field Optical Microscopy for Advanced Material Research".  Germany.  
        doi:10.1002/adma.201804774.

Copy to clipboard


                    
@article{osti_1504499,

  title        = {Modern Scattering‐Type Scanning Near‐Field Optical Microscopy for Advanced Material Research},

  author       = {Chen, Xinzhong and Hu, Debo and Mescall, Ryan and You, Guanjun and Basov, D. N. and Dai, Qing and Liu, Mengkun},

  abstractNote = {},

  doi          = {10.1002/adma.201804774},

  journal      = {Advanced Materials},

  number       = ,

  volume       = ,

  place        = {Germany},

  year         = {2019},

  month        = {4}

}

Copy to clipboard

Free Publicly Accessible Full Text
This content will become publicly available on March 31, 2020
Publisher's Version of Record
10.1002/adma.201804774
https://doi.org/10.1002/adma.201804774

Works referenced in this record:

Surface-Enhanced Raman Spectroscopy
journal, July 2008

Stiles, Paul L.; Dieringer, Jon A.; Shah, Nilam C.
Annual Review of Analytical Chemistry, Vol. 1, Issue 1, p. 601-626
DOI: 10.1146/annurev.anchem.1.031207.112814

High dielectric constant oxides
journal, December 2004

Robertson, J.
The European Physical Journal Applied Physics, Vol. 28, Issue 3, p. 265-291
DOI: 10.1051/epjap:2004206

Similar Records

Similar records in DOE PAGES and OSTI.GOV collections:

Predicting scattering scanning near-field optical microscopy of mass-produced plasmonic devices

Journal Article Otto, Lauren M. ; Burgos, Stanley P. ; Staffaroni, Matteo ; ... May 2018 - Journal of Applied Physics
Widely tuneable scattering-type scanning near-field optical microscopy using pulsed quantum cascade lasers

Journal Article - in OSTI.gov collection Yoxall, Edward, E-mail: edward.yoxall@imperial.ac.uk ; Rahmani, Mohsen ; Maier, Stefan A. ; ... November 2013 - Applied Physics Letters

We demonstrate the use of a pulsed quantum cascade laser, wavelength tuneable between 6 and 10 μm, with a scattering-type scanning near-field optical microscope (s-SNOM). A simple method for calculating the signal-to-noise ratio (SNR) of the s-SNOM measurement is presented. For pulsed lasers, the SNR is shown to be highly dependent on the degree of synchronization between the laser pulse and the sampling circuitry; in measurements on a gold sample, the SNR is 26 with good synchronization and less than 1 without. Simulations and experimental s-SNOM images, with a resolution of 100 nm, corresponding to λ/80, and an acquisition time of lessmore »« less
Full Text Available
Phase stabilized homodyne of infrared scattering type scanning near-field optical microscopy

Journal Article - in OSTI.gov collection Xu, Xiaoji G., E-mail: xgx214@lehigh.edu ; Gilburd, Leonid ; Walker, Gilbert C., E-mail: gwalker@chem.utoronto.ca December 2014 - Applied Physics Letters

Scattering type scanning near-field optical microscopy (s-SNOM) allows sub diffraction limited spatial resolution. Interferometric homodyne detection in s-SNOM can amplify the signal and extract vibrational responses based on sample absorption. A stable reference phase is required for a high quality homodyne-detected near-field signal. This work presents the development of a phase stabilization mechanism for s-SNOM to provide stable homodyne conditions. The phase stability is found to be better than 0.05 rad for the mid infrared light source. Phase stabilization results in improved near field images and vibrational spectroscopies. Spatial inhomogeneities of the boron nitride nanotubes are measured and compared.
Full Text Available
Plasmon-Tunable Tip Pyramids: Monopole Nanoantennas for Near-Field Scanning Optical Microscopy

Journal Article Vasconcelos, Thiago L. ; Archanjo, Bráulio S. ; Oliveira, Bruno S. ; ... August 2018 - Advanced Optical Materials
Reflection-mode scattering-type scanning near-field optical microscope using a laser trapped gold colloidal particle as a scattering probe

Journal Article - in OSTI.gov collection Konada, Takeshi ; Sasaki, Hiroko ; Yamaguchi, Mitsushiro ; ... June 2001 - Journal of Applied Physics

We have developed a reflection-mode scattering-type scanning near-field optical microscope using a laser trapped gold colloidal particle as a scattering probe and succeeded in observing the reflectance change of an opaque semiconductor sample with the alternating layers of GaAs and Al{sub 0.55}Ga{sub 0.45}As. The spatial resolution became as high as 200 nm when using a 200 nm gold colloidal particle. The results indicated that the resolution obtained in the experiment is in good agreement with the trapped particle size and overcame the diffraction limit (420 nm) of the lens system. {copyright} 2001 American Institute of Physics.
Full Text Available

Access journal articles and accepted manuscripts resulting from DOE research funding

Title: Modern Scattering‐Type Scanning Near‐Field Optical Microscopy for Advanced Material Research

Access journal articles and accepted manuscripts
resulting from DOE research funding