High-efficiency in situ resonant inelastic x-ray scattering (iRIXS) endstation at the Advanced Light Source
Abstract
In this paper, an endstation with two high-efficiency soft x-ray spectrographs was developed at Beamline 8.0.1 of the Advanced Light Source, Lawrence Berkeley National Laboratory. The endstation is capable of performing soft x-ray absorption spectroscopy, emission spectroscopy, and, in particular, resonant inelastic soft x-ray scattering (RIXS). Two slit-less variable line-spacing grating spectrographs are installed at different detection geometries. The endstation covers the photon energy range from 80 to 1500 eV. For studying transition-metal oxides, the large detection energy window allows a simultaneous collection of x-ray emission spectra with energies ranging from the O K-edge to the Ni L-edge without moving any mechanical components. The record-high efficiency enables the recording of comprehensive two-dimensional RIXS maps with good statistics within a short acquisition time. By virtue of the large energy window and high throughput of the spectrographs, partial fluorescence yield and inverse partial fluorescence yield signals could be obtained for all transition metal L-edges including Mn. Finally and moreover, the different geometries of these two spectrographs (parallel and perpendicular to the horizontal polarization of the beamline) provide contrasts in RIXS features with two different momentum transfers.
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- Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States). Advanced Light Source
- Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States). Advanced Light Source; Shandong Univ., Jinan (China). School of Physics. National Key Lab. of Crystal Materials
- Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States). Advanced Light Source; Peking Univ. Shenzhen Graduate School, Shenzhen (China). School of Advanced Materials
- Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States). Advanced Light Source; Binghamton Univ., NY (United States). Dept. of Materials Science and Engineering
- Univ. of Wurzburg (Germany)
- Univ. of Nevada, Las Vegas, NV (United States). Dept. of Chemistry and Biochemistry
- Univ. of Nevada, Las Vegas, NV (United States). Dept. of Chemistry and Biochemistry; Karlsruhe Inst. of Technology (KIT) (Germany). Inst. for Photon Science and Synchrotron Radiation (IPS). Inst. for Chemical Technology and Polymer Chemistry (ITCP)
- Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States). Engineering Division
- Shandong Univ., Jinan (China). School of Physics. National Key Lab. of Crystal Materials
- Peking Univ. Shenzhen Graduate School, Shenzhen (China). School of Advanced Materials
- Binghamton Univ., NY (United States). Dept. of Materials Science and Engineering
- Publication Date:
- Research Org.:
- Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States); Energy Frontier Research Centers (EFRC) (United States). Northeastern Center for Chemical Energy Storage (NECCES)
- Sponsoring Org.:
- USDOE Office of Science (SC), Basic Energy Sciences (BES); LBNL Laboratory Directed Research and Development (LDRD) Program; National Natural Science Foundation of China (NSFC); China Scholarship Council (CSC)
- OSTI Identifier:
- 1436337
- Alternate Identifier(s):
- OSTI ID: 1373968
- Grant/Contract Number:
- AC02-05CH11231; SC0012583; SC0001294; 11434006; B13029
- Resource Type:
- Accepted Manuscript
- Journal Name:
- Review of Scientific Instruments
- Additional Journal Information:
- Journal Volume: 88; Journal Issue: 3; Journal ID: ISSN 0034-6748
- Publisher:
- American Institute of Physics (AIP)
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 47 OTHER INSTRUMENTATION; excitation energies; X-ray spectroscopy; transition metals; photons; diffraction gratings; mirrors; grating spectrometers; soft X-rays; fluorescence spectra
Citation Formats
Qiao, Ruimin, Li, Qinghao, Zhuo, Zengqing, Sallis, Shawn, Fuchs, Oliver, Blum, Monika, Weinhardt, Lothar, Heske, Clemens, Pepper, John, Jones, Michael, Brown, Adam, Spucces, Adrian, Chow, Ken, Smith, Brian, Glans, Per-Anders, Chen, Yanxue, Yan, Shishen, Pan, Feng, Piper, Louis F. J., Denlinger, Jonathan, Guo, Jinghua, Hussain, Zahid, Chuang, Yi-De, and Yang, Wanli. High-efficiency in situ resonant inelastic x-ray scattering (iRIXS) endstation at the Advanced Light Source. United States: N. p., 2017.
Web. doi:10.1063/1.4977592.
Qiao, Ruimin, Li, Qinghao, Zhuo, Zengqing, Sallis, Shawn, Fuchs, Oliver, Blum, Monika, Weinhardt, Lothar, Heske, Clemens, Pepper, John, Jones, Michael, Brown, Adam, Spucces, Adrian, Chow, Ken, Smith, Brian, Glans, Per-Anders, Chen, Yanxue, Yan, Shishen, Pan, Feng, Piper, Louis F. J., Denlinger, Jonathan, Guo, Jinghua, Hussain, Zahid, Chuang, Yi-De, & Yang, Wanli. High-efficiency in situ resonant inelastic x-ray scattering (iRIXS) endstation at the Advanced Light Source. United States. https://doi.org/10.1063/1.4977592
Qiao, Ruimin, Li, Qinghao, Zhuo, Zengqing, Sallis, Shawn, Fuchs, Oliver, Blum, Monika, Weinhardt, Lothar, Heske, Clemens, Pepper, John, Jones, Michael, Brown, Adam, Spucces, Adrian, Chow, Ken, Smith, Brian, Glans, Per-Anders, Chen, Yanxue, Yan, Shishen, Pan, Feng, Piper, Louis F. J., Denlinger, Jonathan, Guo, Jinghua, Hussain, Zahid, Chuang, Yi-De, and Yang, Wanli. Fri .
"High-efficiency in situ resonant inelastic x-ray scattering (iRIXS) endstation at the Advanced Light Source". United States. https://doi.org/10.1063/1.4977592. https://www.osti.gov/servlets/purl/1436337.
@article{osti_1436337,
title = {High-efficiency in situ resonant inelastic x-ray scattering (iRIXS) endstation at the Advanced Light Source},
author = {Qiao, Ruimin and Li, Qinghao and Zhuo, Zengqing and Sallis, Shawn and Fuchs, Oliver and Blum, Monika and Weinhardt, Lothar and Heske, Clemens and Pepper, John and Jones, Michael and Brown, Adam and Spucces, Adrian and Chow, Ken and Smith, Brian and Glans, Per-Anders and Chen, Yanxue and Yan, Shishen and Pan, Feng and Piper, Louis F. J. and Denlinger, Jonathan and Guo, Jinghua and Hussain, Zahid and Chuang, Yi-De and Yang, Wanli},
abstractNote = {In this paper, an endstation with two high-efficiency soft x-ray spectrographs was developed at Beamline 8.0.1 of the Advanced Light Source, Lawrence Berkeley National Laboratory. The endstation is capable of performing soft x-ray absorption spectroscopy, emission spectroscopy, and, in particular, resonant inelastic soft x-ray scattering (RIXS). Two slit-less variable line-spacing grating spectrographs are installed at different detection geometries. The endstation covers the photon energy range from 80 to 1500 eV. For studying transition-metal oxides, the large detection energy window allows a simultaneous collection of x-ray emission spectra with energies ranging from the O K-edge to the Ni L-edge without moving any mechanical components. The record-high efficiency enables the recording of comprehensive two-dimensional RIXS maps with good statistics within a short acquisition time. By virtue of the large energy window and high throughput of the spectrographs, partial fluorescence yield and inverse partial fluorescence yield signals could be obtained for all transition metal L-edges including Mn. Finally and moreover, the different geometries of these two spectrographs (parallel and perpendicular to the horizontal polarization of the beamline) provide contrasts in RIXS features with two different momentum transfers.},
doi = {10.1063/1.4977592},
journal = {Review of Scientific Instruments},
number = 3,
volume = 88,
place = {United States},
year = {Fri Mar 17 00:00:00 EDT 2017},
month = {Fri Mar 17 00:00:00 EDT 2017}
}
Web of Science
Figures / Tables:
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