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Title: High-efficiency in situ resonant inelastic x-ray scattering (iRIXS) endstation at the Advanced Light Source

In this paper, an endstation with two high-efficiency soft x-ray spectrographs was developed at Beamline 8.0.1 of the Advanced Light Source, Lawrence Berkeley National Laboratory. The endstation is capable of performing soft x-ray absorption spectroscopy, emission spectroscopy, and, in particular, resonant inelastic soft x-ray scattering (RIXS). Two slit-less variable line-spacing grating spectrographs are installed at different detection geometries. The endstation covers the photon energy range from 80 to 1500 eV. For studying transition-metal oxides, the large detection energy window allows a simultaneous collection of x-ray emission spectra with energies ranging from the O K-edge to the Ni L-edge without moving any mechanical components. The record-high efficiency enables the recording of comprehensive two-dimensional RIXS maps with good statistics within a short acquisition time. By virtue of the large energy window and high throughput of the spectrographs, partial fluorescence yield and inverse partial fluorescence yield signals could be obtained for all transition metal L-edges including Mn. Finally and moreover, the different geometries of these two spectrographs (parallel and perpendicular to the horizontal polarization of the beamline) provide contrasts in RIXS features with two different momentum transfers.
Authors:
 [1] ;  [2] ;  [3] ;  [4] ;  [5] ;  [6] ;  [7] ; ORCiD logo [7] ;  [1] ; ORCiD logo [1] ;  [8] ;  [8] ;  [8] ;  [8] ;  [1] ;  [9] ; ORCiD logo [9] ;  [10] ; ORCiD logo [11] ;  [1] more »; ORCiD logo [1] ;  [1] ;  [1] ; ORCiD logo [1] « less
  1. Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States). Advanced Light Source
  2. Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States). Advanced Light Source; Shandong Univ., Jinan (China). School of Physics. National Key Lab. of Crystal Materials
  3. Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States). Advanced Light Source; Peking Univ. Shenzhen Graduate School, Shenzhen (China). School of Advanced Materials
  4. Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States). Advanced Light Source; Binghamton Univ., NY (United States). Dept. of Materials Science and Engineering
  5. Univ. of Wurzburg (Germany)
  6. Univ. of Nevada, Las Vegas, NV (United States). Dept. of Chemistry and Biochemistry
  7. Univ. of Nevada, Las Vegas, NV (United States). Dept. of Chemistry and Biochemistry; Karlsruhe Inst. of Technology (KIT) (Germany). Inst. for Photon Science and Synchrotron Radiation (IPS). Inst. for Chemical Technology and Polymer Chemistry (ITCP)
  8. Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States). Engineering Division
  9. Shandong Univ., Jinan (China). School of Physics. National Key Lab. of Crystal Materials
  10. Peking Univ. Shenzhen Graduate School, Shenzhen (China). School of Advanced Materials
  11. Binghamton Univ., NY (United States). Dept. of Materials Science and Engineering
Publication Date:
Grant/Contract Number:
AC02-05CH11231; SC0012583; 11434006; B13029
Type:
Accepted Manuscript
Journal Name:
Review of Scientific Instruments
Additional Journal Information:
Journal Volume: 88; Journal Issue: 3; Journal ID: ISSN 0034-6748
Publisher:
American Institute of Physics (AIP)
Research Org:
Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States); Binghamton Univ., NY (United States); Shandong Univ., Jinan (China)
Sponsoring Org:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22); LBNL Laboratory Directed Research and Development (LDRD) Program; National Natural Science Foundation of China (NNSFC); China Scholarship Council (CSC)
Country of Publication:
United States
Language:
English
Subject:
47 OTHER INSTRUMENTATION; excitation energies; X-ray spectroscopy; transition metals; photons; diffraction gratings; mirrors; grating spectrometers; soft X-rays; fluorescence spectra
OSTI Identifier:
1436337
Alternate Identifier(s):
OSTI ID: 1373968

Qiao, Ruimin, Li, Qinghao, Zhuo, Zengqing, Sallis, Shawn, Fuchs, Oliver, Blum, Monika, Weinhardt, Lothar, Heske, Clemens, Pepper, John, Jones, Michael, Brown, Adam, Spucces, Adrian, Chow, Ken, Smith, Brian, Glans, Per-Anders, Chen, Yanxue, Yan, Shishen, Pan, Feng, Piper, Louis F. J., Denlinger, Jonathan, Guo, Jinghua, Hussain, Zahid, Chuang, Yi-De, and Yang, Wanli. High-efficiency in situ resonant inelastic x-ray scattering (iRIXS) endstation at the Advanced Light Source. United States: N. p., Web. doi:10.1063/1.4977592.
Qiao, Ruimin, Li, Qinghao, Zhuo, Zengqing, Sallis, Shawn, Fuchs, Oliver, Blum, Monika, Weinhardt, Lothar, Heske, Clemens, Pepper, John, Jones, Michael, Brown, Adam, Spucces, Adrian, Chow, Ken, Smith, Brian, Glans, Per-Anders, Chen, Yanxue, Yan, Shishen, Pan, Feng, Piper, Louis F. J., Denlinger, Jonathan, Guo, Jinghua, Hussain, Zahid, Chuang, Yi-De, & Yang, Wanli. High-efficiency in situ resonant inelastic x-ray scattering (iRIXS) endstation at the Advanced Light Source. United States. doi:10.1063/1.4977592.
Qiao, Ruimin, Li, Qinghao, Zhuo, Zengqing, Sallis, Shawn, Fuchs, Oliver, Blum, Monika, Weinhardt, Lothar, Heske, Clemens, Pepper, John, Jones, Michael, Brown, Adam, Spucces, Adrian, Chow, Ken, Smith, Brian, Glans, Per-Anders, Chen, Yanxue, Yan, Shishen, Pan, Feng, Piper, Louis F. J., Denlinger, Jonathan, Guo, Jinghua, Hussain, Zahid, Chuang, Yi-De, and Yang, Wanli. 2017. "High-efficiency in situ resonant inelastic x-ray scattering (iRIXS) endstation at the Advanced Light Source". United States. doi:10.1063/1.4977592. https://www.osti.gov/servlets/purl/1436337.
@article{osti_1436337,
title = {High-efficiency in situ resonant inelastic x-ray scattering (iRIXS) endstation at the Advanced Light Source},
author = {Qiao, Ruimin and Li, Qinghao and Zhuo, Zengqing and Sallis, Shawn and Fuchs, Oliver and Blum, Monika and Weinhardt, Lothar and Heske, Clemens and Pepper, John and Jones, Michael and Brown, Adam and Spucces, Adrian and Chow, Ken and Smith, Brian and Glans, Per-Anders and Chen, Yanxue and Yan, Shishen and Pan, Feng and Piper, Louis F. J. and Denlinger, Jonathan and Guo, Jinghua and Hussain, Zahid and Chuang, Yi-De and Yang, Wanli},
abstractNote = {In this paper, an endstation with two high-efficiency soft x-ray spectrographs was developed at Beamline 8.0.1 of the Advanced Light Source, Lawrence Berkeley National Laboratory. The endstation is capable of performing soft x-ray absorption spectroscopy, emission spectroscopy, and, in particular, resonant inelastic soft x-ray scattering (RIXS). Two slit-less variable line-spacing grating spectrographs are installed at different detection geometries. The endstation covers the photon energy range from 80 to 1500 eV. For studying transition-metal oxides, the large detection energy window allows a simultaneous collection of x-ray emission spectra with energies ranging from the O K-edge to the Ni L-edge without moving any mechanical components. The record-high efficiency enables the recording of comprehensive two-dimensional RIXS maps with good statistics within a short acquisition time. By virtue of the large energy window and high throughput of the spectrographs, partial fluorescence yield and inverse partial fluorescence yield signals could be obtained for all transition metal L-edges including Mn. Finally and moreover, the different geometries of these two spectrographs (parallel and perpendicular to the horizontal polarization of the beamline) provide contrasts in RIXS features with two different momentum transfers.},
doi = {10.1063/1.4977592},
journal = {Review of Scientific Instruments},
number = 3,
volume = 88,
place = {United States},
year = {2017},
month = {3}
}

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