A new endstation at the Swiss Light Source for ultraviolet photoelectron spectroscopy, X-ray photoelectron spectroscopy, and X-ray absorption spectroscopy measurements of liquid solutions

Journal Article · Mon Jul 15 00:00:00 EDT 2013 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.4812786· OSTI ID:22220559

Brown, Matthew A.; Redondo, Amaia Beloqui; Duyckaerts, Nicolas; Mächler, Jean-Pierre ^[1]; Jordan, Inga; Wörner, Hans Jakob ^[2]; Lee, Ming-Tao; Ammann, Markus; Nolting, Frithjof; Kleibert, Armin; Huthwelker, Thomas; Birrer, Mario; Honegger, Juri; Wetter, Reto ^[3]; Bokhoven, Jeroen A. van ^[1]

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1. Institute for Chemical and Bioengineering, ETH Zürich, CH-8093 Zürich (Switzerland)
2. Laboratory of Physical Chemistry, ETH Zürich, CH-8093 Zürich (Switzerland)
3. Paul Scherrer Institute, CH-5232 Villigen PSI (Switzerland)

A new liquid microjet endstation designed for ultraviolet (UPS) and X-ray (XPS) photoelectron, and partial electron yield X-ray absorption (XAS) spectroscopies at the Swiss Light Source is presented. The new endstation, which is based on a Scienta HiPP-2 R4000 electron spectrometer, is the first liquid microjet endstation capable of operating in vacuum and in ambient pressures up to the equilibrium vapor pressure of liquid water at room temperature. In addition, the Scienta HiPP-2 R4000 energy analyzer of this new endstation allows for XPS measurements up to 7000 eV electron kinetic energy that will enable electronic structure measurements of bulk solutions and buried interfaces from liquid microjet samples. The endstation is designed to operate at the soft X-ray SIM beamline and at the tender X-ray Phoenix beamline. The endstation can also be operated using a Scienta 5 K ultraviolet helium lamp for dedicated UPS measurements at the vapor-liquid interface using either He I or He II α lines. The design concept, first results from UPS, soft X-ray XPS, and partial electron yield XAS measurements, and an outlook to the potential of this endstation are presented.

• OSTI ID: 22220559
• Journal Information: Review of Scientific Instruments, Vol. 84, Issue 7; Other Information: (c) 2013 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0034-6748
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
37 INORGANIC
ORGANIC
PHYSICAL AND ANALYTICAL CHEMISTRY
ABSORPTION SPECTROSCOPY
DESIGN
ELECTRON SPECTROMETERS
ELECTRONS
LIQUIDS
SOFT X RADIATION
SOLUTIONS
SWISS LIGHT SOURCE
ULTRAVIOLET RADIATION
VAPOR PRESSURE
X-RAY PHOTOELECTRON SPECTROSCOPY
X-RAY SPECTROSCOPY