Identification and Analysis of Partial Shading Breakdown Sites in CuInxGa(1-x)Se2 Modules

Palmiotti, Elizabeth; Johnston, Steven; Gerber, Andreas; Guthrey, Harvey L.; Rockett, Angus; Mansfield, Lorelle M; Silverman, Timothy J.; Al-Jassim, Mowafak M.

doi:10.1016/j.solener.2017.12.019

Title: Identification and Analysis of Partial Shading Breakdown Sites in CuIn_xGa_(1-x)Se₂ Modules

Abstract

In this paper, CuIn_xGa_{(1-x) (CIGS) mini-modules are stressed under reverse bias, resembling partial shading conditions, to predict and characterize where failures occur. Partial shading can cause permanent damage in the form of 'wormlike' defects on thin-film modules due to thermal runaway. This results in module-scale power losses. We have used dark lock-in thermography (DLIT) to spatially observe localized heating when reverse-bias breakdown occurs on various CIGS mini-modules. For better understanding of how and where these defects originated and propagated, we have developed techniques where the current is limited during reverse-bias stressing. This allows for DLIT-based detection and detailed studying of the region where breakdown is initiated before thermal runaway leads to permanent damage. Statistics of breakdown sites using current-limited conditions has allowed for reasonable identification of the as-grown defects where permanent breakdown will likely originate. Scanning electron microscope results and wormlike defect analysis show that breakdown originates in defects such as small pits, craters, or cracks in the CIGS layer, and the wormlike defects propagate near the top CIGS interface.}

Authors:

Palmiotti, Elizabeth ^[1]; Johnston, Steven ^[2]; Gerber, Andreas ^[3]; Guthrey, Harvey L. ^[2]; Rockett, Angus ^[1]; Mansfield, Lorelle M ^[2]; Silverman, Timothy J. ^[2]; Al-Jassim, Mowafak M. ^[2]

Colorado School of Mines, Golden, CO (United States)
National Renewable Energy Lab. (NREL), Golden, CO (United States)
Forschungszentrum Julich (Germany)

Publication Date:: Wed Dec 20 00:00:00 EST 2017

Research Org.:: National Renewable Energy Laboratory (NREL), Golden, CO (United States)

Sponsoring Org.:: USDOE Office of Energy Efficiency and Renewable Energy (EERE), Renewable Power Office. Solar Energy Technologies Office

OSTI Identifier:: 1426646

Alternate Identifier(s):: OSTI ID: 1549003

Report Number(s):: NREL/JA-5K00-70651
Journal ID: ISSN 0038-092X

Grant/Contract Number:: AC36-08GO28308; EE0007141

Resource Type:: Accepted Manuscript

Journal Name:: Solar Energy

Additional Journal Information:: Journal Volume: 161; Journal Issue: Feb. 2018; Journal ID: ISSN 0038-092X

Publisher:: Elsevier

Country of Publication:: United States

Language:: English

Subject:: 14 SOLAR ENERGY; imaging; reliability; accelerated aging; CIGS; thermal analysis; breakdown voltage

Citation Formats


                    Palmiotti, Elizabeth, Johnston, Steven, Gerber, Andreas, Guthrey, Harvey L., Rockett, Angus, Mansfield, Lorelle M, Silverman, Timothy J., and Al-Jassim, Mowafak M. Identification and Analysis of Partial Shading Breakdown Sites in CuInxGa(1-x)Se2 Modules.  United States: N. p., 2017. 
Web.  doi:10.1016/j.solener.2017.12.019.

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                    Palmiotti, Elizabeth, Johnston, Steven, Gerber, Andreas, Guthrey, Harvey L., Rockett, Angus, Mansfield, Lorelle M, Silverman, Timothy J., & Al-Jassim, Mowafak M. Identification and Analysis of Partial Shading Breakdown Sites in CuInxGa(1-x)Se2 Modules.  United States.  https://doi.org/10.1016/j.solener.2017.12.019

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                    Palmiotti, Elizabeth, Johnston, Steven, Gerber, Andreas, Guthrey, Harvey L., Rockett, Angus, Mansfield, Lorelle M, Silverman, Timothy J., and Al-Jassim, Mowafak M. Wed .  
"Identification and Analysis of Partial Shading Breakdown Sites in CuInxGa(1-x)Se2 Modules".  United States.  https://doi.org/10.1016/j.solener.2017.12.019.  https://www.osti.gov/servlets/purl/1426646.

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@article{osti_1426646,

  title        = {Identification and Analysis of Partial Shading Breakdown Sites in CuInxGa(1-x)Se2 Modules},

  author       = {Palmiotti, Elizabeth and Johnston, Steven and Gerber, Andreas and Guthrey, Harvey L. and Rockett, Angus and Mansfield, Lorelle M and Silverman, Timothy J. and Al-Jassim, Mowafak M.},

  abstractNote = {In this paper, CuInxGa(1-x) (CIGS) mini-modules are stressed under reverse bias, resembling partial shading conditions, to predict and characterize where failures occur. Partial shading can cause permanent damage in the form of 'wormlike' defects on thin-film modules due to thermal runaway. This results in module-scale power losses. We have used dark lock-in thermography (DLIT) to spatially observe localized heating when reverse-bias breakdown occurs on various CIGS mini-modules. For better understanding of how and where these defects originated and propagated, we have developed techniques where the current is limited during reverse-bias stressing. This allows for DLIT-based detection and detailed studying of the region where breakdown is initiated before thermal runaway leads to permanent damage. Statistics of breakdown sites using current-limited conditions has allowed for reasonable identification of the as-grown defects where permanent breakdown will likely originate. Scanning electron microscope results and wormlike defect analysis show that breakdown originates in defects such as small pits, craters, or cracks in the CIGS layer, and the wormlike defects propagate near the top CIGS interface.},

  doi          = {10.1016/j.solener.2017.12.019},

  journal      = {Solar Energy},

  number       = Feb. 2018,

  volume       = 161,

  place        = {United States},

  year         = {Wed Dec 20 00:00:00 EST 2017},

  month        = {Wed Dec 20 00:00:00 EST 2017}

}

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Journal Article:

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Accepted Manuscript (DOE)

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https://doi.org/10.1016/j.solener.2017.12.019

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Cited by: 19 works

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Figures / Tables:

Table 1: Statistics summarizing predicted breakdown sites.

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Works referenced in this record:

Microplasma breakdown and hot-spots in silicon solar cells
journal, September 1989

Bishop, J. W.
Solar Cells, Vol. 26, Issue 4
DOI: 10.1016/0379-6787(89)90093-8

Correlations of Cu(In, Ga)Se ₂ imaging with device performance, defects, and microstructural properties
journal, July 2012

Johnston, Steve; Unold, Thomas; Repins, Ingrid
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, Vol. 30, Issue 4
DOI: 10.1116/1.4714358

Investigation of damage caused by partial shading of CuInxGa _(1-x) Se ₂ photovoltaic modules with bypass diodes : Investigation of damage caused by partial shading
journal, April 2016

Lee, Ji Eun; Bae, Soohyun; Oh, Wonwook
Progress in Photovoltaics: Research and Applications, Vol. 24, Issue 8
DOI: 10.1002/pip.2738

Thermal and Electrical Effects of Partial Shade in Monolithic Thin-Film Photovoltaic Modules
journal, November 2015

Silverman, Timothy J.; Deceglie, Michael G.; Sun, Xingshu
IEEE Journal of Photovoltaics, Vol. 5, Issue 6
DOI: 10.1109/JPHOTOV.2015.2478071

Partial shade stress test for thin-film photovoltaic modules
conference, September 2015

Silverman, Timothy J.; Deceglie, Michael G.; Deline, Chris
SPIE Optics + Photonics for Sustainable Energy, SPIE Proceedings
DOI: 10.1117/12.2188774

Characterization of Cu(In,Ga)Se2 photovoltaic modules
journal, May 2007

Dyk, E. E. van; Radue, C.; Gxasheka, A. R.
Thin Solid Films, Vol. 515, Issue 15
DOI: 10.1016/j.tsf.2006.12.065

Works referencing / citing this record:

Impact of Buffer Layer Process and Na on Shunt Paths of Monolithic Series-connected CIGSSe Thin Film Solar Cells
journal, March 2019

Bin Mo, Chan; Park, Se Jin; Bae, Soohyun
Scientific Reports, Vol. 9, Issue 1
DOI: 10.1038/s41598-019-38945-5

A full overview of international standards assessing the long-term stability of perovskite solar cells
journal, January 2018

Holzhey, Philippe; Saliba, Michael
Journal of Materials Chemistry A, Vol. 6, Issue 44
DOI: 10.1039/c8ta06950f

Characterization and modeling of reverse‐bias breakdown in Cu(In,Ga)Se ₂ photovoltaic devices
journal, June 2019

Guthrey, Harvey; Nardone, Marco; Johnston, Steve
Progress in Photovoltaics: Research and Applications, Vol. 27, Issue 9
DOI: 10.1002/pip.3168

Reliability implications of partial shading on CIGS photovoltaic devices: A literature review
journal, December 2019

Bakker, Klaas; Weeber, Arthur; Theelen, Mirjam
Journal of Materials Research, Vol. 34, Issue 24
DOI: 10.1557/jmr.2019.373

Impact of Buffer Layer Process and Na on Shunt Paths of Monolithic Series-connected CIGSSe Thin Film Solar Cells
journal, March 2019

Bin Mo, Chan; Park, Se Jin; Bae, Soohyun
Scientific Reports, Vol. 9, Issue 1
DOI: 10.1038/s41598-019-38945-5

Figures / Tables found in this record:

Figures/Tables have been extracted from DOE-funded journal article accepted manuscripts.

Similar Records in DOE PAGES and OSTI.GOV collections:

Identifying Reverse-Bias Breakdown Sites in CuInxGa(1-x)Se2

Conference Johnston, Steven ; Palmiotti, Elizabeth ; Gerber, Andreas ; ...

CIGS mini-modules are stressed under reverse bias, resembling partial shading conditions, to predict and characterize where failure occurs. Partial shading can cause permanent damage in the form of 'wormlike' defects on thin-film modules due to thermal runaway. We use electroluminescence (EL) imaging and dark lock-in thermography (DLIT) to supplement current-voltage curves when reverse-bias breakdown occurs on various CIGS minimodules. For better understanding of how these defects originate and propagate, we have implemented a current-limited, reverse-bias stressing technique. This allowed for DLIT-based detection and detailed study of the region where breakdown initiates before thermal runaway leads to permanent damage. A correlationmore »« less
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Thin-film module sections are stressed under reverse bias to simulate partial shading conditions. Such stresses can cause permanent damage in the form of 'wormlike' defects due to thermal runaway. When large reverse biases with limited current are applied to the cells, dark lock-in thermography (DLIT) can detect where spatially-localized breakdown initiates before thermal runaway leads to permanent damage. Predicted breakdown defect sites have been identified in both CIGS and CdTe modules using DLIT. These defects include small pinholes, craters, or voids in the absorber layer of the film that lead to built-in areas of weakness where high current densities maymore »« less
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Thin-Film Module Reverse-Bias Breakdown Sites Identified by Thermal Imaging

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Thin-film module sections are stressed under reverse bias to simulate partial shading conditions. Such stresses can cause permanent damage in the form of 'wormlike' defects due to thermal runaway. When large reverse biases with limited current are applied to the cells, dark lock-in thermography (DLIT) can detect where spatially-localized breakdown initiates before thermal runaway leads to permanent damage. Predicted breakdown defect sites have been identified in both CIGS and CdTe modules using DLIT. These defects include small pinholes, craters, or voids in the absorber layer of the film that lead to built-in areas of weakness where high current densities maymore »« less
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Thin-Film Module Reverse-Bias Breakdown Sites Identified by Thermal Imaging

Conference Johnston, Steven ; Sulas, Dana ; Palmiotti, Elizabeth ; ...

Thin-film module sections are stressed under reverse bias to simulate partial shading conditions. Such stresses can cause permanent damage in the form of "wormlike" defects due to thermal runaway. When large reverse biases with limited current are applied to the cells, dark lock-in thermography (DLIT) can detect where spatially-localized breakdown initiates before thermal runaway leads to permanent damage. Predicted breakdown defect sites have been identified in both CIGS and CdTe modules using DLIT. These defects include small pinholes, craters, or voids in the absorber layer of the film that lead to builtin areas of weakness where high current densities maymore »« less
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Characterization and modeling of reverse-bias breakdown in Cu(In,Ga)Se₂ photovoltaic devices

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Abstract Partial shading of series‐connected thin‐film photovoltaic modules can force shaded cells into reverse bias, which can cause rapid and irreversible power loss and reduce the practical module lifespan. Unfortunately, this is a common occurrence in field‐deployed modules due to the myriad of environmental factors that can result in partial shading. In this work, we identify as‐grown nonuniformities in the Cu(In _, Ga)Se ₂ (CIGS) absorber layers as the points of origin for the damage induced under reverse‐bias conditions. The structure and chemistry associated with inclusions and voids in the CIGS films cause these features to act as resistive heatingmore »« less
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Similar Records

Title: Identification and Analysis of Partial Shading Breakdown Sites in CuInxGa(1-x)Se2 Modules

Abstract

Citation Formats

Figures / Tables:

Microplasma breakdown and hot-spots in silicon solar cells journal, September 1989

Correlations of Cu(In, Ga)Se 2 imaging with device performance, defects, and microstructural properties journal, July 2012

Investigation of damage caused by partial shading of CuInxGa (1-x) Se 2 photovoltaic modules with bypass diodes : Investigation of damage caused by partial shading journal, April 2016

Thermal and Electrical Effects of Partial Shade in Monolithic Thin-Film Photovoltaic Modules journal, November 2015

Partial shade stress test for thin-film photovoltaic modules conference, September 2015

Characterization of Cu(In,Ga)Se2 photovoltaic modules journal, May 2007

Impact of Buffer Layer Process and Na on Shunt Paths of Monolithic Series-connected CIGSSe Thin Film Solar Cells journal, March 2019

A full overview of international standards assessing the long-term stability of perovskite solar cells journal, January 2018

Characterization and modeling of reverse‐bias breakdown in Cu(In,Ga)Se 2 photovoltaic devices journal, June 2019

Reliability implications of partial shading on CIGS photovoltaic devices: A literature review journal, December 2019

Impact of Buffer Layer Process and Na on Shunt Paths of Monolithic Series-connected CIGSSe Thin Film Solar Cells journal, March 2019

Title: Identification and Analysis of Partial Shading Breakdown Sites in CuIn_xGa_(1-x)Se₂ Modules

Microplasma breakdown and hot-spots in silicon solar cells
journal, September 1989

Correlations of Cu(In, Ga)Se ₂ imaging with device performance, defects, and microstructural properties
journal, July 2012

Investigation of damage caused by partial shading of CuInxGa _(1-x) Se ₂ photovoltaic modules with bypass diodes : Investigation of damage caused by partial shading
journal, April 2016

Thermal and Electrical Effects of Partial Shade in Monolithic Thin-Film Photovoltaic Modules
journal, November 2015

Partial shade stress test for thin-film photovoltaic modules
conference, September 2015

Characterization of Cu(In,Ga)Se2 photovoltaic modules
journal, May 2007

Impact of Buffer Layer Process and Na on Shunt Paths of Monolithic Series-connected CIGSSe Thin Film Solar Cells
journal, March 2019

A full overview of international standards assessing the long-term stability of perovskite solar cells
journal, January 2018

Characterization and modeling of reverse‐bias breakdown in Cu(In,Ga)Se ₂ photovoltaic devices
journal, June 2019

Reliability implications of partial shading on CIGS photovoltaic devices: A literature review
journal, December 2019

Impact of Buffer Layer Process and Na on Shunt Paths of Monolithic Series-connected CIGSSe Thin Film Solar Cells
journal, March 2019