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Title: Oxygen-modulated quantum conductance for ultrathin HfO 2 -based memristive switching devices

Abstract

Memristive switching devices, candidates for resistive random access memory technology, have been shown to switch off through a progression of states with quantized conductance and subsequent noninteger conductance (in terms of conductance quantum G0). We have performed calculations based on density functional theory to model the switching process for a Pt-HfO2-Pt structure, involving the movement of one or two oxygen atoms. Oxygen atoms moving within a conductive oxygen vacancy filament act as tunneling barriers, and partition the filament into weakly coupled quantum wells. We show that the low-bias conductance decreases exponentially when one oxygen atom moves away from interface. In conclusion, our results demonstrate the high sensitivity of the device conductance to the position of oxygen atoms.

Authors:
 [1];  [2];  [1];  [3]
  1. Argonne National Lab. (ANL), Argonne, IL (United States). Materials Science Division
  2. National Physical Lab., Teddington (United Kingdom)
  3. Argonne National Lab. (ANL), Argonne, IL (United States). Materials Science Division; Northwestern Univ., Evanston, IL (United States). Northwestern-Argonne Inst. for Science and Engineering
Publication Date:
Research Org.:
Argonne National Laboratory (ANL), Argonne, IL (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES); European Union (EU)
OSTI Identifier:
1352621
Alternate Identifier(s):
OSTI ID: 1329951
Grant/Contract Number:  
AC02-06CH11357; 688282
Resource Type:
Accepted Manuscript
Journal Name:
Physical Review B
Additional Journal Information:
Journal Volume: 94; Journal Issue: 16; Journal ID: ISSN 2469-9950
Publisher:
American Physical Society (APS)
Country of Publication:
United States
Language:
English
Subject:
47 OTHER INSTRUMENTATION

Citation Formats

Zhong, Xiaoliang, Rungger, Ivan, Zapol, Peter, and Heinonen, Olle. Oxygen-modulated quantum conductance for ultrathin HfO2 -based memristive switching devices. United States: N. p., 2016. Web. doi:10.1103/PhysRevB.94.165160.
Zhong, Xiaoliang, Rungger, Ivan, Zapol, Peter, & Heinonen, Olle. Oxygen-modulated quantum conductance for ultrathin HfO2 -based memristive switching devices. United States. https://doi.org/10.1103/PhysRevB.94.165160
Zhong, Xiaoliang, Rungger, Ivan, Zapol, Peter, and Heinonen, Olle. Mon . "Oxygen-modulated quantum conductance for ultrathin HfO2 -based memristive switching devices". United States. https://doi.org/10.1103/PhysRevB.94.165160. https://www.osti.gov/servlets/purl/1352621.
@article{osti_1352621,
title = {Oxygen-modulated quantum conductance for ultrathin HfO2 -based memristive switching devices},
author = {Zhong, Xiaoliang and Rungger, Ivan and Zapol, Peter and Heinonen, Olle},
abstractNote = {Memristive switching devices, candidates for resistive random access memory technology, have been shown to switch off through a progression of states with quantized conductance and subsequent noninteger conductance (in terms of conductance quantum G0). We have performed calculations based on density functional theory to model the switching process for a Pt-HfO2-Pt structure, involving the movement of one or two oxygen atoms. Oxygen atoms moving within a conductive oxygen vacancy filament act as tunneling barriers, and partition the filament into weakly coupled quantum wells. We show that the low-bias conductance decreases exponentially when one oxygen atom moves away from interface. In conclusion, our results demonstrate the high sensitivity of the device conductance to the position of oxygen atoms.},
doi = {10.1103/PhysRevB.94.165160},
journal = {Physical Review B},
number = 16,
volume = 94,
place = {United States},
year = {Mon Oct 24 00:00:00 EDT 2016},
month = {Mon Oct 24 00:00:00 EDT 2016}
}

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Cited by: 8 works
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