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Title: In situ study of heavy ion irradiation response of immiscible Cu/Fe multilayers

By providing active defect sinks that capture and annihilate radiation induced defect clusters immiscible metallic multilayers with incoherent interfaces can effectively reduce defect density in ion irradiated metals. Although it is anticipated that defect density within the layers should vary as a function of distance to the layer interface, there is, to date, little in situ TEM evidence to validate this hypothesis. In our study monolithic Cu films and Cu/Fe multilayers with individual layer thickness, h, of 100 and 5 nm were subjected to in situ Cu ion irradiation at room temperature to nominally 1 displacement-per-atom inside a transmission electron microscope. Rapid formation and propagation of defect clusters were observed in monolithic Cu, whereas fewer defects with smaller dimensions were generated in Cu/Fe multilayers with smaller h. Moreover, in situ video shows that the cumulative defect density in Cu/Fe 100 nm multilayers indeed varies, as a function of distance to the layer interfaces, supporting a long postulated hypothesis.
Authors:
 [1] ;  [2] ;  [3] ;  [4] ;  [3] ;  [5] ;  [6]
  1. Texas A & M Univ., College Station, TX (United States). Dept. of Materials Science and Engineering; Los Alamos National Lab. (LANL), Los Alamos, NM (United States). MPA-CINT
  2. Los Alamos National Lab. (LANL), Los Alamos, NM (United States). MPA-CINT
  3. Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
  4. Texas A & M Univ., College Station, TX (United States). Dept. of Materials Science and Engineering
  5. Texas A & M Univ., College Station, TX (United States). Dept. of Materials Science and Engineering and Dept. of Electrical and Computer Engineering
  6. Texas A & M Univ., College Station, TX (United States). Dept. of Materials Science and Engineering and Dept. of Mechanical Engineering; Purdue Univ., West Lafayette, IN (United States). School of Materials Engineering
Publication Date:
Report Number(s):
SAND2016-12630J; LA-UR-17-24399
Journal ID: ISSN 0022-3115; 649924
Grant/Contract Number:
AC04-94AL85000; AC52-06NA25396
Type:
Accepted Manuscript
Journal Name:
Journal of Nuclear Materials
Additional Journal Information:
Journal Volume: 475; Journal Issue: C; Journal ID: ISSN 0022-3115
Publisher:
Elsevier
Research Org:
Sandia National Lab. (SNL-NM), Albuquerque, NM (United States); Los Alamos National Lab. (LANL), Los Alamos, NM (United States)
Sponsoring Org:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22); USDOE National Nuclear Security Administration (NNSA)
Country of Publication:
United States
Language:
English
Subject:
11 NUCLEAR FUEL CYCLE AND FUEL MATERIALS; In situ ion irradiation; Heavy ion irradiation; Immiscible interfaces; Cu/Fe multilayers; Size effect
OSTI Identifier:
1338392
Alternate Identifier(s):
OSTI ID: 1341168; OSTI ID: 1409776

Chen, Youxing, Li, Nan, Bufford, Daniel Charles, Li, Jin, Hattar, Khalid Mikhiel, Wang, Haiyan, and Zhang, Xinghang. In situ study of heavy ion irradiation response of immiscible Cu/Fe multilayers. United States: N. p., Web. doi:10.1016/j.jnucmat.2016.04.009.
Chen, Youxing, Li, Nan, Bufford, Daniel Charles, Li, Jin, Hattar, Khalid Mikhiel, Wang, Haiyan, & Zhang, Xinghang. In situ study of heavy ion irradiation response of immiscible Cu/Fe multilayers. United States. doi:10.1016/j.jnucmat.2016.04.009.
Chen, Youxing, Li, Nan, Bufford, Daniel Charles, Li, Jin, Hattar, Khalid Mikhiel, Wang, Haiyan, and Zhang, Xinghang. 2016. "In situ study of heavy ion irradiation response of immiscible Cu/Fe multilayers". United States. doi:10.1016/j.jnucmat.2016.04.009. https://www.osti.gov/servlets/purl/1338392.
@article{osti_1338392,
title = {In situ study of heavy ion irradiation response of immiscible Cu/Fe multilayers},
author = {Chen, Youxing and Li, Nan and Bufford, Daniel Charles and Li, Jin and Hattar, Khalid Mikhiel and Wang, Haiyan and Zhang, Xinghang},
abstractNote = {By providing active defect sinks that capture and annihilate radiation induced defect clusters immiscible metallic multilayers with incoherent interfaces can effectively reduce defect density in ion irradiated metals. Although it is anticipated that defect density within the layers should vary as a function of distance to the layer interface, there is, to date, little in situ TEM evidence to validate this hypothesis. In our study monolithic Cu films and Cu/Fe multilayers with individual layer thickness, h, of 100 and 5 nm were subjected to in situ Cu ion irradiation at room temperature to nominally 1 displacement-per-atom inside a transmission electron microscope. Rapid formation and propagation of defect clusters were observed in monolithic Cu, whereas fewer defects with smaller dimensions were generated in Cu/Fe multilayers with smaller h. Moreover, in situ video shows that the cumulative defect density in Cu/Fe 100 nm multilayers indeed varies, as a function of distance to the layer interfaces, supporting a long postulated hypothesis.},
doi = {10.1016/j.jnucmat.2016.04.009},
journal = {Journal of Nuclear Materials},
number = C,
volume = 475,
place = {United States},
year = {2016},
month = {4}
}