SAW determination of surface area of thin films
Abstract
N.sub.2 adsorption isotherms are measured from thin films on SAW devices. The isotherms may be used to determine the surface area and pore size distribution of thin films.
- Inventors:
-
- Albuquerque, NM
- Issue Date:
- Research Org.:
- AT&T
- OSTI Identifier:
- 867485
- Patent Number(s):
- 4947677
- Assignee:
- United States of America as represented by United States (Washington, DC)
- Patent Classifications (CPCs):
-
G - PHYSICS G01 - MEASURING G01N - INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- DOE Contract Number:
- AC04-76DP00789
- Resource Type:
- Patent
- Country of Publication:
- United States
- Language:
- English
- Subject:
- determination; surface; films; adsorption; isotherms; measured; devices; determine; pore; size; distribution; size distribution; pore size; sorption isotherms; /73/
Citation Formats
Frye, Gregory C, Martin, Stephen J, and Ricco, Antonio J. SAW determination of surface area of thin films. United States: N. p., 1990.
Web.
Frye, Gregory C, Martin, Stephen J, & Ricco, Antonio J. SAW determination of surface area of thin films. United States.
Frye, Gregory C, Martin, Stephen J, and Ricco, Antonio J. Mon .
"SAW determination of surface area of thin films". United States. https://www.osti.gov/servlets/purl/867485.
@article{osti_867485,
title = {SAW determination of surface area of thin films},
author = {Frye, Gregory C and Martin, Stephen J and Ricco, Antonio J},
abstractNote = {N.sub.2 adsorption isotherms are measured from thin films on SAW devices. The isotherms may be used to determine the surface area and pore size distribution of thin films.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1990},
month = {1}
}
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