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Title: Quantitation of absorbed or deposited materials on a substrate that measures energy deposition

Abstract

This invention provides a system and method for measuring an energy differential that correlates to quantitative measurement of an amount mass of an applied localized material. Such a system and method remains compatible with other methods of analysis, such as, for example, quantitating the elemental or isotopic content, identifying the material, or using the material in biochemical analysis.

Inventors:
; ; ;
Issue Date:
Research Org.:
The Regents of the Univ. of California, Oakland, CA (United States); Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1175207
Patent Number(s):
6844543
Application Number:
10/434,590
Assignee:
The Regents of the University of California (Oakland, CA)
Patent Classifications (CPCs):
H - ELECTRICITY H01 - BASIC ELECTRIC ELEMENTS H01J - ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
DOE Contract Number:  
W-7405-ENG-48
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE

Citation Formats

Grant, Patrick G., Bakajin, Olgica, Vogel, John S., and Bench, Graham. Quantitation of absorbed or deposited materials on a substrate that measures energy deposition. United States: N. p., 2005. Web.
Grant, Patrick G., Bakajin, Olgica, Vogel, John S., & Bench, Graham. Quantitation of absorbed or deposited materials on a substrate that measures energy deposition. United States.
Grant, Patrick G., Bakajin, Olgica, Vogel, John S., and Bench, Graham. Tue . "Quantitation of absorbed or deposited materials on a substrate that measures energy deposition". United States. https://www.osti.gov/servlets/purl/1175207.
@article{osti_1175207,
title = {Quantitation of absorbed or deposited materials on a substrate that measures energy deposition},
author = {Grant, Patrick G. and Bakajin, Olgica and Vogel, John S. and Bench, Graham},
abstractNote = {This invention provides a system and method for measuring an energy differential that correlates to quantitative measurement of an amount mass of an applied localized material. Such a system and method remains compatible with other methods of analysis, such as, for example, quantitating the elemental or isotopic content, identifying the material, or using the material in biochemical analysis.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2005},
month = {1}
}

Patent:

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