Quantitation of absorbed or deposited materials on a substrate that measures energy deposition
Abstract
This invention provides a system and method for measuring an energy differential that correlates to quantitative measurement of an amount mass of an applied localized material. Such a system and method remains compatible with other methods of analysis, such as, for example, quantitating the elemental or isotopic content, identifying the material, or using the material in biochemical analysis.
- Inventors:
- Issue Date:
- Research Org.:
- The Regents of the Univ. of California, Oakland, CA (United States); Lawrence Livermore National Laboratory (LLNL), Livermore, CA (United States)
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 1175207
- Patent Number(s):
- 6844543
- Application Number:
- 10/434,590
- Assignee:
- The Regents of the University of California (Oakland, CA)
- Patent Classifications (CPCs):
-
H - ELECTRICITY H01 - BASIC ELECTRIC ELEMENTS H01J - ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- DOE Contract Number:
- W-7405-ENG-48
- Resource Type:
- Patent
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 36 MATERIALS SCIENCE
Citation Formats
Grant, Patrick G., Bakajin, Olgica, Vogel, John S., and Bench, Graham. Quantitation of absorbed or deposited materials on a substrate that measures energy deposition. United States: N. p., 2005.
Web.
Grant, Patrick G., Bakajin, Olgica, Vogel, John S., & Bench, Graham. Quantitation of absorbed or deposited materials on a substrate that measures energy deposition. United States.
Grant, Patrick G., Bakajin, Olgica, Vogel, John S., and Bench, Graham. Tue .
"Quantitation of absorbed or deposited materials on a substrate that measures energy deposition". United States. https://www.osti.gov/servlets/purl/1175207.
@article{osti_1175207,
title = {Quantitation of absorbed or deposited materials on a substrate that measures energy deposition},
author = {Grant, Patrick G. and Bakajin, Olgica and Vogel, John S. and Bench, Graham},
abstractNote = {This invention provides a system and method for measuring an energy differential that correlates to quantitative measurement of an amount mass of an applied localized material. Such a system and method remains compatible with other methods of analysis, such as, for example, quantitating the elemental or isotopic content, identifying the material, or using the material in biochemical analysis.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Tue Jan 18 00:00:00 EST 2005},
month = {Tue Jan 18 00:00:00 EST 2005}
}
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