Chemical Solution Based Epitaxial Oxide Filmes on Biaxially Textured Ni-W Substrates with Improved Out-of-Plane Texture for YBCO Coated Conductors
- ORNL
Epitaxial films of rare-earth (RE) niobates (where the rare earth includes La, Ce, and Nd) and lanthanum tantalate with pyrochlore structures were grown directly on biaxially textured nickel-3 at.% tungsten (Ni-W) substrates using a chemical solution deposition (CSD) process. Scanning electron microscopy (SEM) and atomic force microscopy (AFM) analysis revealed the surface morphology of the films to be smooth and homogeneous. Detailed X-ray diffraction analysis showed that the films of pyrochlore RE niobate and La-tantalate are highly textured with cube-on-cube epitaxy. The overall texture quality of the films was investigated by measuring the full-width half-maximum (FWHM) of the (004) and (222) rocking curves. We observed a sharper texture for both lanthanum niobate (La{sub 3}NbO{sub 7}) and lanthanum tantalate (La{sub 3}TaO{sub 7}) films compared to the underlying Ni-W substrate, though they have a larger lattice misfit with the Ni-W substrates. These results were comparable to the texture improvement observed in vacuum-deposited Y{sub 2}O{sub 3} seed layers. Texture improvement in the seed layer is the key towards obtaining YBCO films with a higher critical current density. Hence, solution-deposited La{sub 3}NbO{sub 7} and La{sub 3}TaO{sub 7} films can be used as a seed layer towards developing all metalorganic-deposited (MOD) buffer/YBCO architectures.
- Research Organization:
- Oak Ridge National Laboratory (ORNL)
- Sponsoring Organization:
- OE USDOE - Office of Electric Transmission and Distribution
- DOE Contract Number:
- AC05-00OR22725
- OSTI ID:
- 978741
- Journal Information:
- Journal of Electronic Materials, Journal Name: Journal of Electronic Materials Journal Issue: 10 Vol. 36; ISSN JECMA5; ISSN 0361-5235
- Country of Publication:
- United States
- Language:
- English
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