Solution Deposition Approaches To Coated Conductor Fabrication on Biaxially Textured Ni-W Alloy Substrates

Conference · Wed Jun 20 04:00:00 EDT 2001

OSTI ID:787473

Sathyamurthy, S ^[1]

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1. ORNL

Sol-gel processing of La{sub 2}Zr{sub 2}O{sub 7} (LZO) was used to process buffer layers on biaxially textured Ni-3 at.%W substrates. A reel-to-reel continuous dip-coating unit was used to deposit the solution buffers. Epitaxial LZO films have been obtained through continuous processing on Ni-3 at.%W substrates with strong texture and uniform microstructure. The carbon content in these films were analyzed using proton resonance Rutherford Backscattering (RBS). The process parameters have been modified so as to study the effect of the carbon content in these films towards further growth of YBCO films with better properties. The LZO buffers were used as seed layers for RABiTS with the architecture of CeO{sub 2}/YSZ/LZO/Ni-3 at.%W, and YBCO films with critical current density (J{sub c}) of 1.9 MA/cm{sup 2} at 77K in self-field, and a J{sub c} of 0.34 MA/cm{sup 2} at 0.5 T, have been obtained.

• Research Organization: Oak Ridge National Lab., TN (US)
• Sponsoring Organization: US Department of Energy (US)
• DOE Contract Number: AC05-00OR22725
• OSTI ID: 787473
• Report Number(s): P01-110936
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
BARIUM OXIDES
CERIUM OXIDES
COPPER OXIDES
CRITICAL CURRENT
DIP COATING
FABRICATION
LANTHANUM OXIDES
MICROSTRUCTURE
NICKEL BASE ALLOYS
SOL-GEL PROCESS
SUBSTRATES
SUPERCONDUCTIVITY
TEXTURE
TUNGSTEN ALLOYS
YTTRIUM OXIDES
ZIRCONIUM OXIDES