High Current Density YBCO Coated Conductors On Strengthened Biaxially Textured Ni-W Substrates
- ORNL
High current density YBa{sub 2}Cu{sub 3}O{sub 7-{delta}} (YBCO) films were fabricated on rolling-assisted biaxially textured substrates (RABiTS) with a layer sequence of CeO{sub 2}/YSZ/(dip-coated or e-beam seed)/Ni-W (3 at. %). Electron-beam evaporation was used to deposit Y{sub 2}O{sub 3} seed layers. A reel-to-reel continuous dip-coating unit was used to deposit Gd{sub 2}O{sub 3} and La{sub 2}Zr{sub 2}O{sub 7} (LZO) seed layers. Scanning Auger Microprobe analysis of the textured Ni-W substrates indicated the presence of sulfur segregation at the surface. This possibly facilitated the growth of epitaxial e-beam Y{sub 2}O{sub 3} seed layers directly on Ni-W substrates through sulfur c2x2 superstructure. Highly aligned, continuous and crack-free Y{sub 2}O{sub 3}, Gd{sub 2}O{sub 3}, LZO seed layers were obtained. Both YSZ and CeO{sub 2} cap layers were deposited on all of these seed layers using rf-magnetron sputtering. The YBCO films were then grown on these buffered Ni-W substrates by either pulsed laser deposition (PLD) or ex-situ BaF{sub 2} precursor process. A high J{sub c} of 1.9 MA/cm{sub 2} at 77 K and self-field was obtained on both Y{sub 2}O{sub 3} and LZO seed layers. The performance of solution seed layers approached that of the vacuum seed layers.
- Research Organization:
- Oak Ridge National Lab., TN (US)
- Sponsoring Organization:
- US Department of Energy (US)
- DOE Contract Number:
- AC05-00OR22725
- OSTI ID:
- 787478
- Report Number(s):
- P01-110895
- Country of Publication:
- United States
- Language:
- English
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