Growth of Rare-earth Niobate-based Pyrochlores on Textured Ni-W Substrates with Ionic Radii Dependency
- ORNL
- University of Houston, Houston
Epitaxial films of rare-earth (RE) niobates, RE{sub 3}NbO{sub 7} with pyrochlore structures, were grown on biaxially textured nickel-3 at.% tungsten (Ni-W) substrates using a chemical solution deposition process. A precursor solution of 0.3--0.50 M concentration of total cations was spin coated on to short samples of Ni-W substrates, and the films were crystallized at 1050--1100 C in a gas mixture of Ar-4% H{sub 2} for 15 min. Detailed studies revealed that RE-niobates with ionic radius ratio R{sub RE}/R{sub Nb} (R = ionic radius) from 1.23 to 1.40 (i.e., Sm, Eu, Gd, Ho, Y, and Yb) grow epitaxially with the pyrochlore structure. X-ray studies showed that the films of pyrochlore RE niobate films were highly textured with cube-on-cube epitaxy. Scanning electron and atomic force microscopy investigations of RE{sub 3}NbO{sub 7} films revealed a fairly dense and smooth microstructure without cracks and porosity. The rare-earth niobate layers may be potentially used as buffer layers for YBa{sub 2}Cu{sub 3}O{sub 7-{delta}} coated conductors.
- Research Organization:
- Oak Ridge National Laboratory (ORNL)
- Sponsoring Organization:
- OE USDOE - Office of Electric Transmission and Distribution
- DOE Contract Number:
- AC05-00OR22725
- OSTI ID:
- 1003196
- Journal Information:
- Journal of Materials Research, Journal Name: Journal of Materials Research Journal Issue: 4 Vol. 20; ISSN 0884-2914
- Country of Publication:
- United States
- Language:
- English
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