Switching Spectroscopy Piezoresponse Force Microscopy of Ferroelectric Materials

Journal Article · Sat Dec 31 23:00:00 EST 2005 · Applied Physics Letters

DOI:https://doi.org/10.1063/1.2172216· OSTI ID:978057

Jesse, Stephen ^[1]; Baddorf, Arthur P ^[1]; Kalinin, Sergei V ^[1]

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1. ORNL

The application of ferroelectric materials for electronic devices necessitates the quantitative study of local switching behavior, including imprint, coercive bias, remanent and saturation responses, and work of switching. Here we introduce switching spectroscopy piezoresponse force microscopy as a tool for real-space imaging of switching properties on the nanoscale. The hysteresis curves, acquired at each point in the image, are analyzed in the thermodynamic and kinetic limits. We expect that this approach will further understanding of the relationships between material microstructure and polarization switching phenomena on the nanoscale, and provide a quantitative tool for ferroelectric-based device characterization.

• Research Organization: Oak Ridge National Laboratory (ORNL)
• Sponsoring Organization: SC USDOE - Office of Science (SC)
• DOE Contract Number: AC05-00OR22725
• OSTI ID: 978057
• Journal Information: Applied Physics Letters, Journal Name: Applied Physics Letters Journal Issue: 6 Vol. 88; ISSN APPLAB; ISSN 0003-6951
• Country of Publication: United States
• Language: English

Related Subjects

71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
FERROELECTRIC MATERIALS
HYSTERESIS
KINETICS
MICROSCOPY
MICROSTRUCTURE
POLARIZATION
SATURATION
SPECTROSCOPY
THERMODYNAMICS