Switching spectroscopy piezoresponse force microscopy of polycrystalline capacitor structures

Journal Article · Wed Dec 31 23:00:00 EST 2008 · Applied Physics Letters

DOI:https://doi.org/10.1063/1.3070543· OSTI ID:1082020

Bintachitt, Patamas ^[1]; Trolier-McKinstry, Susan ^[2]; Seal, Katyayani ^[1]; Jesse, Stephen ^[1]; Kalinin, Sergei V ^[1]

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1. ORNL
2. Pennsylvania State University

Polarization switching in polycrystalline PbZr0.52Ti0.48O3 films on Pt-coated Si substrates was studied by switching spectroscopy piezoresponse force microscopy (SSPFM). Acquisition of multiple hysteresis loops allows polarization switching parameters, including nucleation, coercive biases, and switchable response to be mapped in real space. In contrast to measurements made on the free surface, those on the metal-ferroelectric-metal capacitor structures show the evolution of correlated switching of 102 103 grain clusters with well-defined imprint and nucleation biases. The role of substrate bending on clustering and SSPFM detection mechanisms are discussed. These studies demonstrate real-space imaging of mesoscopic polarization reversal in real-world devices.

• Research Organization: Oak Ridge National Laboratory (ORNL); Center for Nanophase Materials Sciences
• Sponsoring Organization: SC USDOE - Office of Science (SC)
• DOE Contract Number: AC05-00OR22725
• OSTI ID: 1082020
• Journal Information: Applied Physics Letters, Journal Name: Applied Physics Letters Journal Issue: 4 Vol. 94; ISSN 0003-6951
• Publisher: American Institute of Physics (AIP)
• Country of Publication: United States
• Language: English