Local, submicron, strain gradients as the cause of Sn whisker growth.
Journal Article
·
· Appl. Phys. Lett. and a report in Physics Today. July 2009
It has been shown experimentally that local in-plane residual strain gradients occur around the root of spontaneously growing Sn whiskers on the surface of Sn coatings deposited on Cu. The strain distribution has been determined with synchrotron white beam micro Laue diffraction measurements. The observed in-plane residual strain gradients in combination with recently revealed out-of-plane residual strain-depth gradients [M. Sobiech et al., Appl. Phys. Lett. 93, 011906 (2008)] provide the driving forces for whisker growth.
- Research Organization:
- Argonne National Lab. (ANL), Argonne, IL (United States)
- Sponsoring Organization:
- USDOE Office of Science (SC)
- DOE Contract Number:
- DE-AC02-06CH11357
- OSTI ID:
- 967040
- Report Number(s):
- ANL/XSD/JA-65041; APPLAB; TRN: US0904167
- Journal Information:
- Appl. Phys. Lett. and a report in Physics Today. July 2009, Vol. 94, Issue June 2009; ISSN 0003-6951
- Country of Publication:
- United States
- Language:
- ENGLISH
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