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Title: Silicone oil contamination and electrical contact resistance degradation of low-force gold contacts.

Abstract

Hot-switched low-force gold electrical contact testing was performed using a nanomechanical test apparatus to ascertain the sensitivity of simulated microelectromechanical systems (MEMS) contact to silicone oil contamination. The observed cyclic contact resistance degradation was dependent on both closure rate and noncontact applied voltage. The decomposition of silicone oil from electrical arcing was hypothesized as the degradation mechanism.

Authors:
;
Publication Date:
Research Org.:
Sandia National Laboratories
Sponsoring Org.:
USDOE
OSTI Identifier:
951701
Report Number(s):
SAND2006-1028J
TRN: US200913%%14
DOE Contract Number:
AC04-94AL85000
Resource Type:
Journal Article
Resource Relation:
Journal Name: Proposed for publication in the IEEE Journal of Microelectromechanical Systems.
Country of Publication:
United States
Language:
English
Subject:
42 ENGINEERING; ELECTRIC CONTACTS; GOLD; SILICONES; PERFORMANCE TESTING; MICROELECTRONICS; OILS; ELECTRIC CONDUCTIVITY; DECOMPOSITION; ELECTRIC ARCS

Citation Formats

Dugger, Michael Thomas, and Dickrell, Daniel John, III. Silicone oil contamination and electrical contact resistance degradation of low-force gold contacts.. United States: N. p., 2006. Web.
Dugger, Michael Thomas, & Dickrell, Daniel John, III. Silicone oil contamination and electrical contact resistance degradation of low-force gold contacts.. United States.
Dugger, Michael Thomas, and Dickrell, Daniel John, III. Wed . "Silicone oil contamination and electrical contact resistance degradation of low-force gold contacts.". United States. doi:.
@article{osti_951701,
title = {Silicone oil contamination and electrical contact resistance degradation of low-force gold contacts.},
author = {Dugger, Michael Thomas and Dickrell, Daniel John, III},
abstractNote = {Hot-switched low-force gold electrical contact testing was performed using a nanomechanical test apparatus to ascertain the sensitivity of simulated microelectromechanical systems (MEMS) contact to silicone oil contamination. The observed cyclic contact resistance degradation was dependent on both closure rate and noncontact applied voltage. The decomposition of silicone oil from electrical arcing was hypothesized as the degradation mechanism.},
doi = {},
journal = {Proposed for publication in the IEEE Journal of Microelectromechanical Systems.},
number = ,
volume = ,
place = {United States},
year = {Wed Feb 01 00:00:00 EST 2006},
month = {Wed Feb 01 00:00:00 EST 2006}
}