X-RAY PHOTOEMISSION ANALYSIS OF PASSIVATED Cd(1-x)ZnxTe SURFACES FOR IMPROVED RADIATION DETECTORS

Journal Article · Mon May 12 04:00:00 EDT 2008 · Materials Letters

OSTI ID:945502

Nelson, A; Conway, A; Reinhardt, C; Ferreira, J; Nikolic, R; Payne, S

Surface passivation of device-grade CdZnTe was investigated using x-ray photoelectron spectroscopy in combination with transport property measurements after Br-MeOH (2% Br) and KOH/NH{sub 4}F/H{sub 2}O{sub 2} solutions were used to etch and oxidize the surface. High-resolution photoemission measurements on the valence band electronic structure and core lines were used to evaluate the surface chemistry of the chemically treated surfaces. Metal overlayers were then deposited on these chemically treated surfaces and the I-V characteristics measured. The measurements were correlated to understand the effect of interface chemistry on the electronic structure at these interfaces with the goal of optimizing the Schottky barrier height for radiation detector devices.

• Research Organization: Lawrence Livermore National Laboratory (LLNL), Livermore, CA
• Sponsoring Organization: USDOE
• DOE Contract Number: W-7405-ENG-48
• OSTI ID: 945502
• Report Number(s): LLNL-JRNL-404009
• Journal Information: Materials Letters, Journal Name: Materials Letters Journal Issue: 2 Vol. 63; ISSN MLETDJ; ISSN 0167-577X
• Country of Publication: United States
• Language: English

Related Subjects

22 GENERAL STUDIES OF NUCLEAR REACTORS
36 MATERIALS SCIENCE
37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
CHEMISTRY
ELECTRIC CONDUCTIVITY
ELECTRONIC STRUCTURE
PASSIVATION
PHOTOEMISSION
RADIATION DETECTORS
TRANSPORT
VALENCE
X-RAY PHOTOELECTRON SPECTROSCOPY