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PASSIVATION OF SEMICONDUCTOR SURFACES FOR IMPROVED RADIATION DETECTORS: X-RAY PHOTOEMISSION ANALYSIS

Conference ·
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Surface passivation of device-grade radiation detector materials was investigated using x-ray photoelectron spectroscopy in combination with transport property measurements before and after various chemical treatments. Specifically Br-MeOH (2% Br), KOH with NH{sub 4}F/H{sub 2}O{sub 2} and NH{sub 4}OH solutions were used to etch, reduce and oxidize the surface of Cd{sub (1-x)}Zn{sub x}Te semiconductor crystals. Scanning electron microscopy was used to evaluate the resultant microscopic surface morphology. Angle-resolved high-resolution photoemission measurements on the valence band electronic structure and core lines were used to evaluate the surface chemistry of the chemically treated surfaces. Metal overlayers were then deposited on these chemically treated surfaces and the I-V characteristics measured. The measurements were correlated to understand the effect of interface chemistry on the electronic structure at these interfaces with the goal of optimizing the Schottky barrier height for improved radiation detector devices.
Research Organization:
Lawrence Livermore National Laboratory (LLNL), Livermore, CA
Sponsoring Organization:
USDOE
DOE Contract Number:
W-7405-ENG-48
OSTI ID:
924006
Report Number(s):
LLNL-PROC-400091
Country of Publication:
United States
Language:
English

References (7)

Chemical Etching of CdTe in Aqueous Solutions of H2O2-HI-Citric Acid journal June 2007
Photoemission studies of CdTe(100) and the Ag-CdTe(100) interface: Surface structure, growth behavior, Schottky barrier, and surface photovoltage journal November 1986
Study of oxidized cadmium zinc telluride surfaces journal May 1997
Cadmium zinc telluride and its use as a nuclear radiation detector material journal April 2001
Surface states and passivation of p-Cd0.9Zn0.1Te crystal
  • Qiang, Li; Wanqi, Jie
  • Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Vol. 562, Issue 1 https://doi.org/10.1016/j.nima.2006.02.006
journal June 2006
A novel two-step chemical passivation process for CdZnTe detectors journal March 2005
Recent progress in CdTe and CdZnTe detectors journal January 2001

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Related Subjects

36 MATERIALS SCIENCE
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
CHEMISTRY
ELECTRIC CONDUCTIVITY
ELECTRONIC STRUCTURE
MORPHOLOGY
PASSIVATION
PHOTOEMISSION
RADIATION DETECTORS
SCANNING ELECTRON MICROSCOPY
TRANSPORT
VALENCE
X-RAY PHOTOELECTRON SPECTROSCOPY