Transmission electron microscopy study of (103)-oriented epitaxial SrBisub2Nbsub2Osub9 films grown on (111) SrTiOsub3 and (111) SrTiOsub3.

Journal Article · Thu Feb 01 04:00:00 EST 2001 · J. Mater. Res.

DOI:https://doi.org/10.1557/JMR.2001.0072· OSTI ID:943062

Zurbuchen, M A; Lettieri, J; Jia, Y; Schlom, D G; Streiffer, S K; Hawley, M E; LANL,

Portions of the same epitaxial (103)-oriented SrBi{sub 2}Nb{sub 2}O{sub 9} film grown on (111) SrTiO{sub 3} for which we recently reported the highest remanent polarization (P{sub r}) ever achieved in SrBi{sub 2}Nb{sub 2}O{sub 9} (or SrBi{sub 2}Ta{sub 2}O{sub 9}) films, i.e., P{sub r} = 15.7 iC/cm{sup 2}, have been characterized microstructurally by plan-view and cross-sectional transmission electron microscopy (TEM) along three orthogonal viewing directions. SrBi{sub 2}Nb{sub 2}O{sub 9} grows with its c axis tilted 57{sup o} from the substrate surface normal in a three-fold twin structure about the substrate [111], with the growth twins' c axes nominally aligned with the three <100> SrTiO{sub 3} directions. (103) SrBi{sub 2}Nb{sub 2}O{sub 9} films with and without an underlying epitaxial SrRuO{sub 3} bottom electrode have been studied. Dark-field TEM imaging over a 12 im{sup 2} area shows no evidence of second phases (crystalline or amorphous). A high density of out-of-phase boundaries exists in the films.

• Research Organization: Argonne National Laboratory (ANL)
• Sponsoring Organization: SC
• DOE Contract Number: AC02-06CH11357
• OSTI ID: 943062
• Report Number(s): ANL/MSD/JA-37190
• Journal Information: J. Mater. Res., Journal Name: J. Mater. Res. Journal Issue: 2 ; Feb. 2001 Vol. 16; ISSN JMREEE; ISSN 0884-2914
• Country of Publication: United States
• Language: ENGLISH

Related Subjects

36 MATERIALS SCIENCE
BISMUTH COMPOUNDS
DENSITY
ELECTRODES
EPITAXY
GROWTH
NIOBIUM
POLARIZATION
RUTHENIUM OXIDES
STRONTIUM
STRONTIUM OXIDES
STRONTIUM TITANATES
SUBSTRATES
SURFACES
THIN FILMS
TRANSMISSION ELECTRON MICROSCOPY