Ion photon emission microscope

Patent · Tue Apr 22 00:00:00 EDT 2003

OSTI ID:921316

Doyle, Barney L ^[1]

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1. Albuquerque, NM

An ion beam analysis system that creates microscopic multidimensional image maps of the effects of high energy ions from an unfocussed source upon a sample by correlating the exact entry point of an ion into a sample by projection imaging of the ion-induced photons emitted at that point with a signal from a detector that measures the interaction of that ion within the sample. The emitted photons are collected in the lens system of a conventional optical microscope, and projected on the image plane of a high resolution single photon position sensitive detector. Position signals from this photon detector are then correlated in time with electrical effects, including the malfunction of digital circuits, detected within the sample that were caused by the individual ion that created these photons initially.

• Research Organization: Sandia Corporation (Albuquerque, NM)
• Sponsoring Organization: United States Department of Energy
• DOE Contract Number: AC04-94AL85000
• Assignee: Sandia Corporation (Albuquerque, NM)
• Patent Number(s): 6,552,338
• Application Number: 09/882,400
• OSTI ID: 921316
• Country of Publication: United States
• Language: English