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Title: The effects of surface contamination on resistance degradation of hot-switched low-force MEMS electrical contracts.

Conference ·
OSTI ID:915202

No abstract prepared.

Research Organization:
Sandia National Laboratories (SNL), Albuquerque, NM, and Livermore, CA (United States)
Sponsoring Organization:
USDOE
DOE Contract Number:
AC04-94AL85000
OSTI ID:
915202
Report Number(s):
SAND2004-6586C; TRN: US200817%%147
Resource Relation:
Conference: Proposed for presentation at the IEEE 2005 Holm Conference on Electrical Contracts held September 26-28, 2005.
Country of Publication:
United States
Language:
English