The effects of surface contamination on resistance degradation of hot-switched low-force MEMS electrical contacts.
Conference
·
OSTI ID:1116004
Abstract not provided.
- Research Organization:
- Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
- Sponsoring Organization:
- USDOE National Nuclear Security Administration (NNSA)
- DOE Contract Number:
- AC04-94AL85000
- OSTI ID:
- 1116004
- Report Number(s):
- SAND2005-3024C; 498150
- Resource Relation:
- Conference: 2005 Holm Conference on Electrical Contacts held September 26-29, 2005 in Chicago, IL.; Related Information: Proposed for presentation at the 2005 Holm Conference on Electrical Contacts held September 26-29, 2005 in Chicago, IL.
- Country of Publication:
- United States
- Language:
- English
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