The electrical contact resistance and adhesion of intermixed metal thin-films for use in MEMS contact switches.
Conference
·
OSTI ID:948993
No abstract prepared.
- Research Organization:
- Sandia National Laboratories
- Sponsoring Organization:
- USDOE
- DOE Contract Number:
- AC04-94AL85000
- OSTI ID:
- 948993
- Report Number(s):
- SAND2005-1995C
- Country of Publication:
- United States
- Language:
- English
Similar Records
Investigation of electrical contact resistance and adhesion of deposited films for microscale device surfaces.
Percolation Threshold Effects on the Electrical Contact Resistance and Adhesion of Microelectromechanical Systems Thin-Film Materials.
The effects of surface contamination on resistance degradation of hot-switched low-force MEMS electrical contacts.
Conference
·
Wed Sep 01 00:00:00 EDT 2004
·
OSTI ID:945175
Percolation Threshold Effects on the Electrical Contact Resistance and Adhesion of Microelectromechanical Systems Thin-Film Materials.
Conference
·
Sun Oct 01 00:00:00 EDT 2006
·
OSTI ID:1264645
The effects of surface contamination on resistance degradation of hot-switched low-force MEMS electrical contacts.
Conference
·
Sun May 01 00:00:00 EDT 2005
·
OSTI ID:1116004