Particle detector spatial resolution
Patent
·
OSTI ID:868596
- Berkeley, CA
Method and apparatus for producing separated columns of scintillation layer material, for use in detection of X-rays and high energy charged particles with improved spatial resolution. A pattern of ridges or projections is formed on one surface of a substrate layer or in a thin polyimide layer, and the scintillation layer is grown at controlled temperature and growth rate on the ridge-containing material. The scintillation material preferentially forms cylinders or columns, separated by gaps conforming to the pattern of ridges, and these columns direct most of the light produced in the scintillation layer along individual columns for subsequent detection in a photodiode layer. The gaps may be filled with a light-absorbing material to further enhance the spatial resolution of the particle detector.
- Research Organization:
- Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA
- DOE Contract Number:
- AC03-76SF00098
- Assignee:
- Regents of University of California (Oakland, CA)
- Patent Number(s):
- US 5171996
- OSTI ID:
- 868596
- Country of Publication:
- United States
- Language:
- English
High Resolution Phosphor Screen for X-ray Image Intensifier
|
book | January 1980 |
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Related Subjects
/250/216/427/
absorbing material
apparatus
charged
charged particle
charged particles
columns
conforming
containing material
controlled
controlled temperature
cylinders
detection
detector
direct
energy
energy charged
enhance
filled
formed
forms
gaps
grown
growth
growth rate
improved
improved spatial
individual
layer
layer material
light
light produced
light-absorbing
material
method
particle
particle detector
particles
pattern
photodiode
polyimide
preferentially
produced
producing
projections
rate
resolution
ridge-containing
ridges
scintillation
scintillation material
separated
sorbing material
spatial
spatial resolution
subsequent
subsequent detection
substrate
substrate layer
surface
temperature
x-rays
absorbing material
apparatus
charged
charged particle
charged particles
columns
conforming
containing material
controlled
controlled temperature
cylinders
detection
detector
direct
energy
energy charged
enhance
filled
formed
forms
gaps
grown
growth
growth rate
improved
improved spatial
individual
layer
layer material
light
light produced
light-absorbing
material
method
particle
particle detector
particles
pattern
photodiode
polyimide
preferentially
produced
producing
projections
rate
resolution
ridge-containing
ridges
scintillation
scintillation material
separated
sorbing material
spatial
spatial resolution
subsequent
subsequent detection
substrate
substrate layer
surface
temperature
x-rays