Enhanced columnar structure in CsI layer by substrate patterning

Conference · Thu Oct 01 04:00:00 EDT 1992 · IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States)

OSTI ID:6686436

Jing, T; Cho, G; Drewery, J; Kaplan, S N; Mireshaghi, A; Perez-Mendez, V; Wildermuth, D ^[1]; Fujieda, I ^[2]

---

1. Lawrence Berkeley Lab., CA (United States)
2. Xerox Palo Alto Research Center, CA (United States)

This paper reports on columnar structure in evaporated CsI layers which can be controlled by patterning substrates as well as varying evaporation conditions. Mesh-patterned substrates with various dimensions were created by spin-coating polyimide on glass or amorphous silicon substrates and defining patterns with standard photolithography technique. CsI(TI) layers 200-1000 [mu]m were evaporated. Scintillation properties of these evaporated layers, such as light yield and speed, were equivalent to those of the source materials. Spatial resolution of x-ray detectors consisting of these layers and a linear array of Si photodiodes was evaluated by exposing them to a 25 [mu]m narrow beam of X-ray.

• DOE Contract Number: AC03-76SF00098
• OSTI ID: 6686436
• Report Number(s): CONF-911106--
• Conference Information: Journal Name: IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States) Journal Volume: 39:5
• Country of Publication: United States
• Language: English

Related Subjects

38 RADIATION CHEMISTRY, RADIOCHEMISTRY, AND NUCLEAR CHEMISTRY
400702 -- Radiochemistry & Nuclear Chemistry-- Properties of Radioactive Materials
440100 -- Radiation Instrumentation
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
664400 -- Experimentally Derived Information on Atomic & Molecular Properties-- (1992-)
665300* -- Interactions Between Beams & Condensed Matter-- (1992-)
74 ATOMIC AND MOLECULAR PHYSICS
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
ALKALI METAL COMPOUNDS
CESIUM COMPOUNDS
CESIUM IODIDES
ELECTRON MICROSCOPY
ELECTRON TUBES
ELEMENTS
EQUIPMENT
ETCHING
FABRICATION
HALIDES
HALOGEN COMPOUNDS
INORGANIC PHOSPHORS
IODIDES
IODINE COMPOUNDS
MEASURING INSTRUMENTS
MICROSCOPY
PHOSPHORS
PHOTODIODES
RADIATION DETECTORS
RESOLUTION
SCANNING ELECTRON MICROSCOPY
SEMICONDUCTOR DETECTORS
SEMICONDUCTOR DEVICES
SEMICONDUCTOR DIODES
SEMIMETALS
SI SEMICONDUCTOR DETECTORS
SILICON
SPATIAL RESOLUTION
SUBSTRATES
SURFACE FINISHING
X-RAY EQUIPMENT
X-RAY TUBES