X-ray charged particle detection with CsI(Tl) layer coupled to a Si:H photodiode layers

Journal Article · Mon Apr 01 04:00:00 EST 1991 · IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States)

DOI:https://doi.org/10.1109/23.289306· OSTI ID:5090419

Fujieda, I; Street, R A ^[1]; Cho, G; Drewery, J; Gee, T; Jing, T; Kaplan, S N; Perez-Mendez, V; Wildermuth, D ^[2]

---

1. Xerox Palo Alto Research Center, CA (United States)
2. Lawrence Berkeley Lab., CA (United States)

This paper reports on a compact real-time X-ray and charged particle imager with digitized position output built either by coupling a fast scintillator to a photodiode array or by forming one on a photodiode array directly. CsI(T1) layers 100-1000 {mu}m thick were evaporated on glass substrates from a crystal CsI(T1). When coupled to a crystalline Si or amorphous silicon (a-Si:H) photodiode and exposed to calibrated X-ray pulses, their light yields and speed were found to be comparable to those of a crystal CsI(T1). Single {beta} particle detection was demonstrated with this combination. The light spread inside evaporated CsI(T1) was suppressed by its columnar structure. Scintillation detection gives much larger signals than direct X-ray detection due to the increased energy deposition in the detector material. Fabrication of monolithic type X-ray sensors consisting of CsI + a-Si:H photodiodes is discussed.

• DOE Contract Number: AC03-76SF00098
• OSTI ID: 5090419
• Journal Information: IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States), Journal Name: IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States) Vol. 38:2; ISSN 0018-9499; ISSN IETNA
• Country of Publication: United States
• Language: English

Related Subjects

440104* -- Radiation Instrumentation-- High Energy Physics Instrumentation
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
ALKALI METAL COMPOUNDS
CALIBRATION
CESIUM COMPOUNDS
CHARGED PARTICLE DETECTION
DETECTION
ELECTRONIC EQUIPMENT
ELEMENTS
EQUIPMENT
MEASURING INSTRUMENTS
PHOTODIODES
RADIATION DETECTION
RADIATION DETECTORS
REAL TIME SYSTEMS
SCINTILLATION COUNTERS
SEMICONDUCTOR DEVICES
SEMICONDUCTOR DIODES
SEMIMETALS
SILICON
X-RAY DETECTION