X-ray and charged particle detection with CsI(Tl) layer coupled to a-Si:H photodiode layers
Conference
·
OSTI ID:6558837
- Lawrence Berkeley Lab., CA (USA)
- Xerox Palo Alto Research Center, CA (USA)
A compact real-time X-ray and charged particle imager with digitized position output can built either by coupling a fast scintillator to a photodiode array or by forming one on a photodiode array directly. CsI(Tl) layers 100--1000{mu}m thick were evaporated on glass substrates from a crystal CsI(Tl). When coupled to a crystalline Si or amorphous silicon (a-Si:H) photodiode and exposed to calibrated X-ray pulses, their light yields and speed were found to be comparable to those of a crystal CsI(Tl). Single {beta} particle detection was demonstrated with this combination. The light spread inside evaporated CsI(Tl) was suppressed by its columnar structure. Scintillation detection gives much larger signals than direct X-ray detection due to the increased energy deposition in the detector material. Fabrication of monolithic type X-ray sensors consisting of CsI + a-Si:H photodiodes is discussed. 20 refs., 16 figs.
- Research Organization:
- Lawrence Berkeley Lab., CA (USA)
- Sponsoring Organization:
- DOE/ER
- DOE Contract Number:
- AC03-76SF00098
- OSTI ID:
- 6558837
- Report Number(s):
- LBL-29477; CONF-9010226--1; ON: DE91001798
- Country of Publication:
- United States
- Language:
- English
Similar Records
X-ray charged particle detection with CsI(Tl) layer coupled to a Si:H photodiode layers
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Journal Article
·
Sun Mar 31 23:00:00 EST 1991
· IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States)
·
OSTI ID:5090419
Enhanced columnar structure in CsI layer by substrate patterning
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Enhanced columnar structure in CsI layer by substrate patterning
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Related Subjects
440101* -- Radiation Instrumentation-- General Detectors or Monitors & Radiometric Instruments
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
ALKALI METAL COMPOUNDS
BETA DETECTION
CESIUM COMPOUNDS
CESIUM IODIDES
CHARGED PARTICLE DETECTION
DETECTION
ELEMENTS
HALIDES
HALOGEN COMPOUNDS
INORGANIC PHOSPHORS
IODIDES
IODINE COMPOUNDS
MEASURING INSTRUMENTS
PHOSPHORS
PHOTODIODES
PHYSICAL RADIATION EFFECTS
RADIATION DETECTION
RADIATION DETECTORS
RADIATION EFFECTS
RESOLUTION
SCINTILLATION COUNTERS
SEMICONDUCTOR DEVICES
SEMICONDUCTOR DIODES
SEMIMETALS
SILICON
SPATIAL RESOLUTION
X-RAY DETECTION
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
ALKALI METAL COMPOUNDS
BETA DETECTION
CESIUM COMPOUNDS
CESIUM IODIDES
CHARGED PARTICLE DETECTION
DETECTION
ELEMENTS
HALIDES
HALOGEN COMPOUNDS
INORGANIC PHOSPHORS
IODIDES
IODINE COMPOUNDS
MEASURING INSTRUMENTS
PHOSPHORS
PHOTODIODES
PHYSICAL RADIATION EFFECTS
RADIATION DETECTION
RADIATION DETECTORS
RADIATION EFFECTS
RESOLUTION
SCINTILLATION COUNTERS
SEMICONDUCTOR DEVICES
SEMICONDUCTOR DIODES
SEMIMETALS
SILICON
SPATIAL RESOLUTION
X-RAY DETECTION