Skip to main content
U.S. Department of Energy
Office of Scientific and Technical Information

Particle detector spatial resolution

Patent ·
OSTI ID:7117761
Method and apparatus for producing separated columns of scintillation layer material, for use in detection of X-rays and high energy charged particles with improved spatial resolution is disclosed. A pattern of ridges or projections is formed on one surface of a substrate layer or in a thin polyimide layer, and the scintillation layer is grown at controlled temperature and growth rate on the ridge-containing material. The scintillation material preferentially forms cylinders or columns, separated by gaps conforming to the pattern of ridges, and these columns direct most of the light produced in the scintillation layer along individual columns for subsequent detection in a photodiode layer. The gaps may be filled with a light-absorbing material to further enhance the spatial resolution of the particle detector. 12 figs.
DOE Contract Number:
AC03-76SF00098
Assignee:
Univ. of California, Oakland, CA (United States)
Patent Number(s):
A; US 5171996
Application Number:
PPN: US 7-738529
OSTI ID:
7117761
Country of Publication:
United States
Language:
English