Particle detector spatial resolution

Patent · Tue Dec 15 00:00:00 EST 1992

OSTI ID:7117761

Perez-Mendez, V

Method and apparatus for producing separated columns of scintillation layer material, for use in detection of X-rays and high energy charged particles with improved spatial resolution is disclosed. A pattern of ridges or projections is formed on one surface of a substrate layer or in a thin polyimide layer, and the scintillation layer is grown at controlled temperature and growth rate on the ridge-containing material. The scintillation material preferentially forms cylinders or columns, separated by gaps conforming to the pattern of ridges, and these columns direct most of the light produced in the scintillation layer along individual columns for subsequent detection in a photodiode layer. The gaps may be filled with a light-absorbing material to further enhance the spatial resolution of the particle detector. 12 figs.

• DOE Contract Number: AC03-76SF00098
• Assignee: Univ. of California, Oakland, CA (United States)
• Patent Number(s): US 5171996; A
• Application Number: PPN: US 7-738529
• OSTI ID: 7117761
• Resource Relation: Patent File Date: 31 Jul 1991
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
CHARGED PARTICLE DETECTION
SCINTILLATION COUNTERS
DESIGN
X-RAY DETECTION
FABRICATION
PHOTODIODES
DETECTION
MEASURING INSTRUMENTS
RADIATION DETECTION
RADIATION DETECTORS
SEMICONDUCTOR DEVICES
SEMICONDUCTOR DIODES
440101* - Radiation Instrumentation- General Detectors or Monitors & Radiometric Instruments
440104 - Radiation Instrumentation- High Energy Physics Instrumentation