Particle detector spatial resolution

Patent · Wed Jan 01 00:00:00 EST 1992

OSTI ID:868596

Perez-Mendez, Victor ^[1]

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1. Berkeley, CA

Method and apparatus for producing separated columns of scintillation layer material, for use in detection of X-rays and high energy charged particles with improved spatial resolution. A pattern of ridges or projections is formed on one surface of a substrate layer or in a thin polyimide layer, and the scintillation layer is grown at controlled temperature and growth rate on the ridge-containing material. The scintillation material preferentially forms cylinders or columns, separated by gaps conforming to the pattern of ridges, and these columns direct most of the light produced in the scintillation layer along individual columns for subsequent detection in a photodiode layer. The gaps may be filled with a light-absorbing material to further enhance the spatial resolution of the particle detector.

• Research Organization: Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States)
• DOE Contract Number: AC03-76SF00098
• Assignee: Regents of University of California (Oakland, CA)
• Patent Number(s): US 5171996
• OSTI ID: 868596
• Country of Publication: United States
• Language: English

Related Subjects

particle
detector
spatial
resolution
method
apparatus
producing
separated
columns
scintillation
layer
material
detection
x-rays
energy
charged
particles
improved
pattern
ridges
projections
formed
surface
substrate
polyimide
grown
controlled
temperature
growth
rate
ridge-containing
preferentially
forms
cylinders
gaps
conforming
direct
light
produced
individual
subsequent
photodiode
filled
light-absorbing
enhance
substrate layer
light produced
scintillation material
growth rate
controlled temperature
absorbing material
charged particles
charged particle
spatial resolution
particle detector
subsequent detection
containing material
layer material
improved spatial
energy charged
sorbing material
/250/216/427/