Fixture for supporting and aligning a sample to be analyzed in an X-ray diffraction apparatus

Patent · Thu Jan 01 04:00:00 EST 1987

OSTI ID:866132

Green, Lanny A ^[1]

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1. Knoxville, TN

A fixture is provided for supporting and aligning small samples of material on a goniometer for X-ray diffraction analysis. A sample-containing capillary is accurately positioned for rotation in the X-ray beam by selectively adjusting the fixture to position the capillary relative to the x and y axes thereof to prevent wobble and position the sample along the z axis or the axis of rotation. By employing the subject fixture relatively small samples of materials can be analyzed in an X-ray diffraction apparatus previously limited to the analysis of much larger samples.

• Research Organization: LOCKHEED MARTIN ENRGY SYST INC
• DOE Contract Number: AC05-84OR21400
• Assignee: United States of America as represented by United States (Washington, DC)
• Patent Number(s): US 4641329
• OSTI ID: 866132
• Country of Publication: United States
• Language: English

Related Subjects

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accurately
accurately position
accurately positioned
adjusting
aligning
analysis
analyzed
apparatus
axes
axis
beam
capillary
diffraction
employing
fixture
goniometer
larger
limited
material
materials
position
positioned
prevent
previously
provided
relative
relatively
rotation
sample
sample-containing
samples
selectively
subject
supporting
wobble
x-ray
x-ray beam
x-ray diffraction
z
z axis