The multicrystal modular spectrometer for x-ray diffraction studies using SR

Journal Article · Sun Sep 01 04:00:00 EDT 1996 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.1147354· OSTI ID:389575

Kovalchuk, M; Kreines, A; Shilin, Y; Shishkov, V; Kazimirov, A ^[1]

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1. A.V. Shubnikov Institute of Crystallography, Russian Academy of Sciences, Leninskii prosp. 59, Moscow 117333 (Russia)

We suggest a set of elements united in the modular x-ray spectrometer to easily implement multiaxis, multipurpose x-ray diffraction schemes, multiple-diffraction layouts with two-dimensional collimation of the incident beam, surface diffraction schemes, and experiments with various modifications of the x-ray standing wave method. The main elements of the spectrometer are: the one-circle goniometer with the vertical axis, the multicircle research goniometer, and different slit systems. All units except the multicircle goniometer can be mounted on two parallel optical guides. The multicircle goniometer is a stand-alone unit consisting of an Eulerian cradle mounted on a two-circle goniometer. All rotations are driven by stepping motors via worm gears. On axes where fine (to 0.1 arc sec or less) angular positioning is desirable, torsion-element-based rotation is used; it is driven via piezo drivers. A program package was developed to control the experiments. The software is based on the modular principle providing for fast implementation of application programs suited for specific x-ray diffraction methods. The results of multiple-diffraction studies with the use of the instrument are presented. {copyright} {ital 1996 American Institute of Physics.}

• OSTI ID: 389575
• Report Number(s): CONF-9510119--
• Journal Information: Review of Scientific Instruments, Journal Name: Review of Scientific Instruments Journal Issue: 9 Vol. 67; ISSN 0034-6748; ISSN RSINAK
• Country of Publication: United States
• Language: English

Related Subjects

44 INSTRUMENTATION
INCLUDING NUCLEAR AND PARTICLE DETECTORS
CONTROL SYSTEMS
SPECIFICATIONS
SYNCHROTRON RADIATION
USES
X-RAY DIFFRACTION
X-RAY SPECTROMETERS