Measuring Curved Crystal Performance for a High Resolution, Imaging X-ray Spectrometer

Journal Article · Mon Jun 07 04:00:00 EDT 2010 · X-Ray Optics and Instrumentation

DOI:https://doi.org/10.1155/2010/583626· OSTI ID:993431

and Richard Stewart, Michael Haugh

This paper describes the design, crystal selection, and crystal testing for a vertical Johann spectrometer operating in the 13 keV range to measure ion Doppler broadening in inertial confinement plasmas. The spectrometer is designed to use thin, curved, mica crystals to achieve a resolving power of E/ΔE>2000. A number of natural mica crystals were screened for flatness and X-ray diffraction width to find samples of sufficient perfection for use in the instrument. Procedures to select and mount high quality mica samples are discussed. A diode-type X-ray source coupled to a dual goniometer arrangement was used to measure the crystal reflectivity curve. A procedure was developed for evaluating the goniometer performance using a set of diffraction grade Si crystals. This goniometer system was invaluable for identifying the best original crystals for further use and developing the techniques to select satisfactory curved crystals for the spectrometer.

• Research Organization: National Security Technologies, LLC (United States)
• Sponsoring Organization: USDOE; USDOE National Nuclear Security Administration (NA)
• DOE Contract Number: AC52-06NA25946
• OSTI ID: 993431
• Report Number(s): DOE/NV/25946--839
• Journal Information: X-Ray Optics and Instrumentation, Journal Name: X-Ray Optics and Instrumentation Vol. 2010
• Publisher: Hindawi Publishing Corporation
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
DESIGN
DOPPLER BROADENING
GONIOMETERS
INERTIAL CONFINEMENT
KEV RANGE
MICA
PERFORMANCE
PLASMA
TESTING
X-RAY DIFFRACTION
X-RAY SOURCES
X-RAY SPECTROMETERS
X-ray Spectrometer
crystal
high-resolution