Optimizing the Operation of a Vertical Johann Spectrometer Using a High Energy Fluorescer X-ray Source

Conference · Fri Oct 01 04:00:00 EDT 2010 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.3492421· OSTI ID:1136444

Haugh, Michael ^[1]; Stewart, Richard ^[2]

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1. NSTec
2. LLNL

This paper describes the operation and testing for a Vertical Johann Spectrometer (VJS) operating in the 13 keV range. The spectrometer is designed to use thin curved mica crystals or thick germanium crystals. The VJS must have a resolution E/ΔE=3000 or better to measure Doppler broadening of highly ionized krypton and operate at a small X-ray angle in order to be used as a diagnostic in a laser plasma target chamber. The VJS was aligned, tested, and optimized using a fluorescer type high energy X-ray (HEX) source located at National Security Technologies, LLC (NSTec), in Livermore, California. The HEX uses a 160 kV X-ray tube to excite fluorescence from various targets. Both rubidium and bismuth fluorescers were used for this effort. This presentation describes the NSTec HEX system and the methods used to optimize and characterize the VJS performance.

• Research Organization: Nevada Test Site/National Security Technologies, LLC (United States)
• Sponsoring Organization: USDOE National Nuclear Security Administration (NNSA)
• DOE Contract Number: AC52-06NA25946
• OSTI ID: 1136444
• Report Number(s): DOE/NV/25946--990
• Conference Information: Journal Name: Review of Scientific Instruments Journal Issue: 10 Journal Volume: 81
• Country of Publication: United States
• Language: English