Optimizing the operation of a high resolution vertical Johann spectrometer using a high energy fluorescer x-ray source

Journal Article · Fri Oct 15 04:00:00 EDT 2010 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.3492421· OSTI ID:22055903

Haugh, Michael ^[1]; Stewart, Richard ^[2]

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1. National Security Technologies, LLC, 161 S. Vasco Rd., Suite A, Livermore, California 94550 (United States)
2. Lawrence Livermore National Laboratory, 7000 East Ave., Livermore, California 94550 (United States)

This paper describes the operation and testing for a vertical Johann spectrometer (VJS) operating in the 13 keV range. The spectrometer is designed to use thin curved mica crystals or thick germanium crystals. The VJS must have a resolution of E/{Delta}E=3000 or better to measure the Doppler broadening of highly ionized krypton and operate at a small x-ray angle in order to be used as a diagnostic in a laser plasma target chamber. The VJS was aligned, tested, and optimized using a fluorescer type high energy x-ray (HEX) source located at National Security Technologies (NSTec), LLC, in Livermore, CA. The HEX uses a 160 kV x-ray tube to excite fluorescence from various targets. Both rubidium and bismuth fluorescers were used for this effort. This presentation describes the NSTec HEX system and the methods used to optimize and characterize the VJS performance.

• OSTI ID: 22055903
• Journal Information: Review of Scientific Instruments, Journal Name: Review of Scientific Instruments Journal Issue: 10 Vol. 81; ISSN 0034-6748; ISSN RSINAK
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
70 PLASMA PHYSICS AND FUSION TECHNOLOGY
BISMUTH
CRYSTALS
DOPPLER BROADENING
FLUORESCENCE
GERMANIUM
KEV RANGE
KRYPTON
LASER-PRODUCED PLASMA
MICA
OPERATION
OPTIMIZATION
RESOLUTION
RUBIDIUM
TARGET CHAMBERS
X RADIATION
X-RAY SOURCES
X-RAY SPECTROMETERS
X-RAY TUBES