Fixture for supporting and aligning a sample to be analyzed in an X-ray diffraction apparatus

Patent · Thu Jan 01 00:00:00 EST 1987

OSTI ID:866132

Green, Lanny A ^[1]

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1. Knoxville, TN

A fixture is provided for supporting and aligning small samples of material on a goniometer for X-ray diffraction analysis. A sample-containing capillary is accurately positioned for rotation in the X-ray beam by selectively adjusting the fixture to position the capillary relative to the x and y axes thereof to prevent wobble and position the sample along the z axis or the axis of rotation. By employing the subject fixture relatively small samples of materials can be analyzed in an X-ray diffraction apparatus previously limited to the analysis of much larger samples.

• Research Organization: Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)
• DOE Contract Number: AC05-84OR21400
• Assignee: United States of America as represented by United States (Washington, DC)
• Patent Number(s): US 4641329
• OSTI ID: 866132
• Country of Publication: United States
• Language: English

Related Subjects

fixture
supporting
aligning
sample
analyzed
x-ray
diffraction
apparatus
provided
samples
material
goniometer
analysis
sample-containing
capillary
accurately
positioned
rotation
beam
selectively
adjusting
position
relative
axes
prevent
wobble
z
axis
employing
subject
relatively
materials
previously
limited
larger
x-ray diffraction
x-ray beam
z axis
accurately positioned
accurately position
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