Fixture for supporting and aligning a sample to be analyzed in an x-ray diffraction apparatus
Patent
·
OSTI ID:5453961
A fixture is provided for supporting and aligning small samples of material on a goniometer for x-ray diffraction analysis. A sample-containing capillary is accurately positioned for rotation in the x-ray beam by selectively adjusting the fixture to position the capillary relative to the x and y axes thereof to prevent wobble and position the sample along the z axis or the axis of rotation. By employing the subject fixture relatively small samples of materials can be analyzed in an x-ray diffraction apparatus previously limited to the analysis of much larger samples.
- Research Organization:
- Martin Marietta Energy Systems, Inc., Oak Ridge, TN (USA)
- DOE Contract Number:
- AC05-84OR21400
- Assignee:
- Dept. of energy
- Patent Number(s):
- None
- Application Number:
- ON: DE86013807
- OSTI ID:
- 5453961
- Country of Publication:
- United States
- Language:
- English
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