InP:Fe Photoconducting device
Patent
·
OSTI ID:865298
- Los Alamos, NM
- Albuquerque, NM
A photoconducting device fabricated from Fe-doped, semi-insulating InP crystals exhibits an exponential decay transient with decay time inversely related to Fe concentration. Photoconductive gain as high as 5 is demonstrated in photoconducting devices with AuGe and AuSn contacts. Response times from 150 to 1000 picoseconds can be achieved.
- Research Organization:
- Los Alamos National Laboratory (LANL), Los Alamos, NM
- DOE Contract Number:
- W-7405-ENG-36
- Assignee:
- United States of America as represented by United States (Washington, DC)
- Patent Number(s):
- US 4490709
- OSTI ID:
- 865298
- Country of Publication:
- United States
- Language:
- English
Similar Records
InP:Fe photoconducting device
InP:Fe photoconducting device
InP:Fe photoconductors as photodetectors
Patent
·
·
OSTI ID:5444069
InP:Fe photoconducting device
Patent
·
1984
·
OSTI ID:5769523
InP:Fe photoconductors as photodetectors
Journal Article
·
1983
· IEEE Trans. Electron Devices; (United States)
·
OSTI ID:6853184
Related Subjects
/338/257/
1000
150
achieved
auge
ausn
concentration
contacts
crystals
decay
decay time
demonstrated
device
device fabricated
devices
exhibits
exponential
fabricated
fe-doped
inp
inversely
inversely related
photoconducting
photoconducting device
photoconductive
picoseconds
related
response
response time
response times
semi-insulating
time
times
transient
1000
150
achieved
auge
ausn
concentration
contacts
crystals
decay
decay time
demonstrated
device
device fabricated
devices
exhibits
exponential
fabricated
fe-doped
inp
inversely
inversely related
photoconducting
photoconducting device
photoconductive
picoseconds
related
response
response time
response times
semi-insulating
time
times
transient