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Title: In situ real-time studies of oxygen incorporation in complex oxide thin films using spectroscopic ellipsometry and ion scattering and recoil spectrometry

Abstract

The surface termination of c-axis oriented YBa{sub 2}Cu{sub 3}O{sub 7{minus}{delta}} (YBCO) and the oxygen incorporation mechanism has been investigated using a unique combination of spectroscopic ellipsometry (SE) and time of flight ion scattering and recoil spectrometry (ToF-ISARS). The high surface sensitivity of the ToF-ISARS technique combined with the bulk oxygen sensitivity of SE are shown to yield complimentary information. The SE provided the film orientation and quality, while ToF-ISARS supplied surface compositional and structural information and enabled isotopic {sup 18}O tracer studies. It was determined that the O content of the film had little effect on the surface termination of the film, indicating a lack of labile Cu(1) sites at the c-axis oriented YBCO surface. Also, strong evidence for a Ba or BaO terminated structure is shown. The data related to the {sup 18}O tracer studies indicate that O from the reaction ambient incorporates only into the labile Cu(1) sites during both deposition and annealing, while stable O sites were populated with O from the sputtered target, indicating either the need for sputtered atomic O or sputtered YCuO complexes to occupy the stable Cu(2) sites.

Authors:
; ; ; ; ;
Publication Date:
Research Org.:
Argonne National Lab., IL (US)
Sponsoring Org.:
US Department of Energy (US)
OSTI Identifier:
755892
Report Number(s):
ANL/MSD/CP-101998
TRN: US0003638
DOE Contract Number:  
W-31109-ENG-38
Resource Type:
Conference
Resource Relation:
Conference: 2000 MRS Spring Meeting, San Francisco, CA (US), 04/24/2000--04/28/2000; Other Information: PBD: 25 May 2000
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; YTTRIUM OXIDES; BARIUM OXIDES; COPPER OXIDES; SURFACE PROPERTIES; CHEMICAL COMPOSITION; CRYSTAL STRUCTURE

Citation Formats

Mueller, A. H., Gao, Y., Irene, E. A., Auciello, O., Krauss, A. R., and Achultz, J. A. In situ real-time studies of oxygen incorporation in complex oxide thin films using spectroscopic ellipsometry and ion scattering and recoil spectrometry. United States: N. p., 2000. Web.
Mueller, A. H., Gao, Y., Irene, E. A., Auciello, O., Krauss, A. R., & Achultz, J. A. In situ real-time studies of oxygen incorporation in complex oxide thin films using spectroscopic ellipsometry and ion scattering and recoil spectrometry. United States.
Mueller, A. H., Gao, Y., Irene, E. A., Auciello, O., Krauss, A. R., and Achultz, J. A. Thu . "In situ real-time studies of oxygen incorporation in complex oxide thin films using spectroscopic ellipsometry and ion scattering and recoil spectrometry". United States. https://www.osti.gov/servlets/purl/755892.
@article{osti_755892,
title = {In situ real-time studies of oxygen incorporation in complex oxide thin films using spectroscopic ellipsometry and ion scattering and recoil spectrometry},
author = {Mueller, A. H. and Gao, Y. and Irene, E. A. and Auciello, O. and Krauss, A. R. and Achultz, J. A.},
abstractNote = {The surface termination of c-axis oriented YBa{sub 2}Cu{sub 3}O{sub 7{minus}{delta}} (YBCO) and the oxygen incorporation mechanism has been investigated using a unique combination of spectroscopic ellipsometry (SE) and time of flight ion scattering and recoil spectrometry (ToF-ISARS). The high surface sensitivity of the ToF-ISARS technique combined with the bulk oxygen sensitivity of SE are shown to yield complimentary information. The SE provided the film orientation and quality, while ToF-ISARS supplied surface compositional and structural information and enabled isotopic {sup 18}O tracer studies. It was determined that the O content of the film had little effect on the surface termination of the film, indicating a lack of labile Cu(1) sites at the c-axis oriented YBCO surface. Also, strong evidence for a Ba or BaO terminated structure is shown. The data related to the {sup 18}O tracer studies indicate that O from the reaction ambient incorporates only into the labile Cu(1) sites during both deposition and annealing, while stable O sites were populated with O from the sputtered target, indicating either the need for sputtered atomic O or sputtered YCuO complexes to occupy the stable Cu(2) sites.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2000},
month = {5}
}

Conference:
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