A spectroscopic anisotropy ellipsometry study of YBa{sub 2}Cu{sub 3}O{sub 7-x} superconductors.
Journal Article
·
· Thin Solid Films
The effect of the optical anisotropy of the high temperature superconducting compound YBa{sub 2}Cu{sub 3}O{sub 7-{delta}} (YBCO) on spectroscopic ellipsometry (SE) measurements was studied. For this, the method of spectroscopic anisotropy micro-ellipsometry (SAME) was employed on c-axis- as well as on a,b-axes-oriented YBCO single crystals. SAME measures the ellipsometric parameters {Delta} and {Psi} as a function of the angle {alpha} which describes sample rotation around the surface normal. The analysis of the resulting {Delta}({alpha}) and {Psi}({alpha})-curves yielded the ordinary and averaged extraordinary complex refractive indices in the UV-VIS range. Additionally, the crystallographic orientation angle between the optical axis and the surface normal could be determined. The single crystal results were applied to SE measurements performed on differently oriented YBCO thin films which were prepared by ion beam sputter deposition on top of (100) SrTiO{sub 3} substrates. It is shown that SE allows for in-situ monitoring of the crystallographic orientation of thin YBCO films.
- Research Organization:
- Argonne National Laboratory (ANL)
- Sponsoring Organization:
- FOR; NSF; DOD
- DOE Contract Number:
- AC02-06CH11357
- OSTI ID:
- 942738
- Report Number(s):
- ANL/MSD/JA-34113
- Journal Information:
- Thin Solid Films, Journal Name: Thin Solid Films Journal Issue: Feb. 1998 Vol. 313; ISSN THSFAP; ISSN 0040-6090
- Country of Publication:
- United States
- Language:
- ENGLISH
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Thu Dec 31 23:00:00 EST 1992
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OSTI ID:6982626