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Thermal regrowth of ion-damaged YBa sub 2 Cu sub 3 O sub 7 minus sub. delta. superconducting thin films

Journal Article · · Journal of Materials Research; (United States)
 [1];  [2]; ;  [1]
  1. Exploratory Research and Development Center, Los Alamos National Laboratory, Los Alamos, New Mexico 87545 (United States)
  2. Center for Materials Science, Los Alamos National Laboratory, Los Alamos, New Mexico 87545 (United States)
Regrowth of ion-damaged YBa{sub 2}Cu{sub 3}O{sub 7{minus}}{sub {delta}} thin films on LaAlO{sub 3} was studied using the ion beam channeling technique. The damaged films can be regrown at a temperature as low as 650 {degree}C, and are stable up to 1000 {degree}C. The regrowth process was found to be thermally activated with a single activation energy of 0.46 eV, contrary to two energies found in a previous study on the films on MgO (J. A. Martinez {ital et} {ital al}., Appl. Phys. Lett. {bold 57}, 189 (1990)).
OSTI ID:
7306471
Journal Information:
Journal of Materials Research; (United States), Journal Name: Journal of Materials Research; (United States) Vol. 7:3; ISSN JMREE; ISSN 0884-2914
Country of Publication:
United States
Language:
English