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Heterojunction internal photoemission Si[sub 0. 7]Ge[sub 0. 3]/Si infrared detector

Journal Article · · Optical Engineering; (United States)
DOI:https://doi.org/10.1117/12.163403· OSTI ID:7300823
; ; ; ;  [1]
  1. California Inst. of Technology, Pasadena, CA (United States). Jet Propulsion Lab.

Single-layer and multilayer Si[sub 0.7]Ge[sub 0.3]/Si heterojunction internal photoemission (HIP) detectors with cutoff wavelengths out to [approximately]23 [mu]m have been demonstrated. Near-ideal thermionic emission dark current characteristics and photoresponse at wavelengths up to 20 [mu]m were measured. The cutoff wavelength [lambda][sub c] and emission coefficient C[sub 1] of the HIP detectors were determined by the modified Fowler plot at the wavelength regime where the corresponding photon energies were smaller than the Fermi energy ([approximately]0.15 eV) of the degenerate Si[sub 0.7]Ge[sub 0.3] layers. Similar optical and thermal potential barriers were obtained. The use of multiple Si[sub 0.7]Ge[sub 0.3]/Si layers in the stacked HIP detector structure resulted in a significantly increased emission coefficient C[sub 1] compared to the single-layer HIP detectors due to an enhanced internal photoemission efficiency without the loss of IR absorption.

OSTI ID:
7300823
Journal Information:
Optical Engineering; (United States), Journal Name: Optical Engineering; (United States) Vol. 33:3; ISSN 0091-3286; ISSN OPEGAR
Country of Publication:
United States
Language:
English

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