Electron beam cutting
Patent
·
OSTI ID:7249379
A method for the cutting of holes 20 Angstroms in diameter, or lines 20 Angstroms wide in a material having positive ionic conduction by the use of a focused electron probe is described. The holes and lines are stable under ambient conditions. 2 figs.
- DOE Contract Number:
- AC02-76ER01198
- Assignee:
- Univ. Patents, Inc., Westport, CT (United States)
- Patent Number(s):
- A; US 4508952
- Application Number:
- PPN: US 6-467559
- OSTI ID:
- 7249379
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
36 MATERIALS SCIENCE
360101* -- Metals & Alloys-- Preparation & Fabrication
360201 -- Ceramics
Cermets
& Refractories-- Preparation & Fabrication
360601 -- Other Materials-- Preparation & Manufacture
CUTTING
ELECTRIC CONDUCTIVITY
ELECTRICAL PROPERTIES
ELECTRON BEAM MACHINING
IONIC CONDUCTIVITY
MACHINING
MATERIALS
PHYSICAL PROPERTIES
SIZE
360101* -- Metals & Alloys-- Preparation & Fabrication
360201 -- Ceramics
Cermets
& Refractories-- Preparation & Fabrication
360601 -- Other Materials-- Preparation & Manufacture
CUTTING
ELECTRIC CONDUCTIVITY
ELECTRICAL PROPERTIES
ELECTRON BEAM MACHINING
IONIC CONDUCTIVITY
MACHINING
MATERIALS
PHYSICAL PROPERTIES
SIZE