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U.S. Department of Energy
Office of Scientific and Technical Information

Radiation-hardened integrated circuit amplifier: nuclear weapon effects susceptibility study. Final report 1 Jul 1975--30 Jun 1975

Technical Report ·
OSTI ID:7224403

The objective of this program was to measure the permanent degradation and transient circuit response of a radiation-hardened operational amplifier, developed for long-wave infrared (LWIR) sensors, to simulate nuclear weapon effects environments. These included transient radiation effects (TRE), system-generated electromagnetic pulse (SGEMP), and combined nuclear radiation and electrical pulse effects.

Research Organization:
Harry Diamond Labs., Washington, DC (USA)
OSTI ID:
7224403
Report Number(s):
AD-A-029026; HDL-TR-1759
Country of Publication:
United States
Language:
English