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Radiation-hardened transistor and integrated circuit

Patent ·
OSTI ID:919904

A composite transistor is disclosed for use in radiation hardening a CMOS IC formed on an SOI or bulk semiconductor substrate. The composite transistor has a circuit transistor and a blocking transistor connected in series with a common gate connection. A body terminal of the blocking transistor is connected only to a source terminal thereof, and to no other connection point. The blocking transistor acts to prevent a single-event transient (SET) occurring in the circuit transistor from being coupled outside the composite transistor. Similarly, when a SET occurs in the blocking transistor, the circuit transistor prevents the SET from being coupled outside the composite transistor. N-type and P-type composite transistors can be used for each and every transistor in the CMOS IC to radiation harden the IC, and can be used to form inverters and transmission gates which are the building blocks of CMOS ICs.

Research Organization:
Sandia National Laboratories (SNL-NM), Albuquerque, NM
Sponsoring Organization:
United States Department of Energy
DOE Contract Number:
AC04-94AL85000
Assignee:
Sandia Corporation (Albuquerque, NM)
Patent Number(s):
7,298,010
Application Number:
11/358,391
OSTI ID:
919904
Country of Publication:
United States
Language:
English

References (8)

Upset hardened memory design for submicron CMOS technology journal January 1996
SEE in a 0.15 /spl mu/m fully depleted CMOS/SOI commercial Process journal December 2004
Soft error rate mitigation techniques for modern microcircuits
  • Mavis, D. G.; Eaton, P. H.
  • 2002 IEEE International Reliability Physics Symposium Proceedings. 40th Annual, 2002 IEEE International Reliability Physics Symposium. Proceedings. 40th Annual (Cat. No.02CH37320) https://doi.org/10.1109/RELPHY.2002.996639
conference January 2002
A digital CMOS design technique for SEU hardening journal January 2000
Radiation hard LOCOS field oxide journal June 1994
MeV implants boost device design journal January 1995
BUSFET-a radiation-hardened SOI transistor journal January 1999
Production and propagation of single-event transients in high-speed digital logic ICs journal December 2004

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