Potassium-induced charge redistribution on Si(111) surfaces studied by core-level photoemission spectroscopy
Journal Article
·
· Physical Review, B: Condensed Matter; (United States)
- Molecular Science Research Center, Pacific Northwest Laboratories, Richland, Washington 99352 (United States)
- AT T Bell Laboratories, Murray Hill, New Jersey 07974 (United States)
- Department of Chemistry, Ruhr University, 4630 Bochum (Germany)
- Institute of Material Science, University of Tsukuba, Ibaraki 305 (Japan)
High-resolution core-level photoemission spectra of the K/Si(111)(7{times}7) surface system are presented. The Si 2{ital p} results show that potassium adsorption induces a Si 2{ital p} core level to shift to o/Ihighero/P binding energy, i.e., to the opposite direction than that expected from the Si-K electronegativity differences. This result is compared with that of the K/Si(111)({radical}3 {times} {radical}3 ){ital R}30{degree}-B system and is interpreted in terms of the K-induced charge redistribution between the Si-adatom--rest-atom pair.
- DOE Contract Number:
- AC02-76CH00016
- OSTI ID:
- 7207065
- Journal Information:
- Physical Review, B: Condensed Matter; (United States), Journal Name: Physical Review, B: Condensed Matter; (United States) Vol. 45:11; ISSN PRBMD; ISSN 0163-1829
- Country of Publication:
- United States
- Language:
- English
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·
OSTI ID:6182285
Related Subjects
36 MATERIALS SCIENCE
360606* -- Other Materials-- Physical Properties-- (1992-)
ADSORPTION
ALKALI METALS
BINDING ENERGY
CHARGE DISTRIBUTION
ELECTROMAGNETIC RADIATION
ELECTRONIC STRUCTURE
ELEMENTS
EMISSION
ENERGY
IONIZING RADIATIONS
METALS
PHOTOEMISSION
POTASSIUM
RADIATIONS
SECONDARY EMISSION
SEMIMETALS
SILICON
SOFT X RADIATION
SORPTION
SPECTRA
SURFACE PROPERTIES
X RADIATION
X-RAY SPECTRA
360606* -- Other Materials-- Physical Properties-- (1992-)
ADSORPTION
ALKALI METALS
BINDING ENERGY
CHARGE DISTRIBUTION
ELECTROMAGNETIC RADIATION
ELECTRONIC STRUCTURE
ELEMENTS
EMISSION
ENERGY
IONIZING RADIATIONS
METALS
PHOTOEMISSION
POTASSIUM
RADIATIONS
SECONDARY EMISSION
SEMIMETALS
SILICON
SOFT X RADIATION
SORPTION
SPECTRA
SURFACE PROPERTIES
X RADIATION
X-RAY SPECTRA