High total dose effects on CMOS/SOI technology

Journal Article · Mon Jun 01 00:00:00 EDT 1992 · IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States)

DOI:https://doi.org/10.1109/23.277521· OSTI ID:7198455

Flament, O; Dupont-Nivet, E; Leray, J L; Pere, J F; Delagnes, E ^[1]; Auberton-Herve, A J; Giffard, B ^[2]; Borel, G; Ouisse, T ^[3]

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1. CEA, CentER d'Etudes de Bruyeres-Le-Chatel, BP 12,91680 Bruyeres-le-Chatel (FR)
2. CEA,DTA/LETI CENG Grenoble (FR)
3. Thomson Militaire et Spatial, St Egreve (FR)

This paper reports that, CMOS silicon on insulator technology has shown its ability to process hardened components which remain functional after irradiation with a total dose of several tens of Megarads. New tests on elementary transistors and 29101 microprocessor have been made at doses up to 100 Mrad (SiO{sub 2}) and above. Results of irradiation at these total doses are presented for different biases, together with the post-irradiation behavior of the components. All the observations show that new parameters must be taken into account for hardness insurance at a high level of total dose.

• OSTI ID: 7198455
• Journal Information: IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States), Journal Name: IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States) Vol. 39:3; ISSN 0018-9499; ISSN IETNA
• Country of Publication: United States
• Language: English

Related Subjects

440200* -- Radiation Effects on Instrument Components
Instruments
or Electronic Systems
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
CHALCOGENIDES
COMPUTERS
DOSE RATES
ELECTROMAGNETIC RADIATION
ELECTRONIC CIRCUITS
ELEMENTS
HARDENING
IONIZING RADIATIONS
MICROELECTRONIC CIRCUITS
MICROPROCESSORS
MOS TRANSISTORS
OXIDES
OXYGEN COMPOUNDS
PHYSICAL RADIATION EFFECTS
RADIATION EFFECTS
RADIATION HARDENING
RADIATIONS
SEMICONDUCTOR DEVICES
SEMIMETALS
SILICON
SILICON COMPOUNDS
SILICON OXIDES
TECHNOLOGY ASSESSMENT
TRANSISTORS
X RADIATION